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CORC

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Verification of SEU resistance in 65 nm high-performance SRAM with dual DICE interleaving and EDAC mitigation strategies 期刊论文
NUCLEAR SCIENCE AND TECHNIQUES, 2021, 卷号: 32, 期号: 12, 页码: 13
作者:  He, Ze;  Zhao, Shi-Wei;  Liu, Tian-Qi;  Cai, Chang;  Yan, Xiao-Yu
收藏  |  浏览/下载：68/0  |  提交时间：2022/01/12
Design, Application, and Verification of the Novel SEU Tolerant Abacus-Type Layouts 期刊论文
ELECTRONICS, 2021, 卷号: 10, 期号: 23, 页码: 11
作者:  Sun, Yi;  Li, Zhi;  He, Ze;  Chi, Yaqing
收藏  |  浏览/下载：11/0  |  提交时间：2022/04/11
Impacts of carbon ions on SEU in SOI SRAM 期刊论文
MICROELECTRONICS RELIABILITY, 2021, 卷号: 126, 页码: 6
作者:  Gao, J.;  Zhang, Q.;  Xi, K.;  Li, B.;  Wang, C.
收藏  |  浏览/下载：25/0  |  提交时间：2022/01/24
SEE  SEU  SOI SRAM  C  
Design and verification of multiple SEU mitigated circuits on SRAM-based FPGA system 期刊论文
MICROELECTRONICS RELIABILITY, 2021, 卷号: 126, 页码: 7
作者:  Yu, Jian;  Cai, Chang;  Ning, Bingxu;  Gao, Shuai;  Liu, Tianqi
收藏  |  浏览/下载：25/0  |  提交时间：2022/01/24
Measurement and evaluation of the Single Event Effects of high-performance SerDes circuits 期刊论文
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2021, 卷号: 1012, 页码: 11
作者:  Wang, Shu;  Cai, Chang;  Ning, Bingxu;  He, Ze;  Huang, Zhiqin
收藏  |  浏览/下载：19/0  |  提交时间：2021/12/08
Impact of heavy ion energy and species on single-event upset in commercial floating gate cells 期刊论文
MICROELECTRONICS RELIABILITY, 2021, 卷号: 120, 页码: 6
作者:  Ye, Bing;  Mo, Li-Hua;  Zhai, Peng-Fei;  Cai, Li;  Liu, Tao
收藏  |  浏览/下载：40/0  |  提交时间：2021/12/09
Neutron-induced single event upset simulation in Geant4 for three-dimensional die-stacked SRAM* 期刊论文
CHINESE PHYSICS B, 2021, 卷号: 30, 期号: 3, 页码: 8
作者:  Mo, Li-Hua;  Ye, Bing;  Liu, Jie;  Luo, Jie;  Sun, You-Mei
收藏  |  浏览/下载：33/0  |  提交时间：2021/12/10
Influence of Orbital Parameters on SEU Rate of Low-Energy Proton in Nano-SRAM Device 期刊论文
SYMMETRY-BASEL, 2020, 卷号: 12, 期号: 12, 页码: 10
作者:  Ye, Bing;  Mo, Li-Hua;  Liu, Tao;  Sun, You-Mei;  Liu, Jie
收藏  |  浏览/下载：13/0  |  提交时间：2021/12/13
Investigation of single event effect in 28-nm system-on-chip with multi patterns* 期刊论文
CHINESE PHYSICS B, 2020, 卷号: 29, 期号: 10, 页码: 5
作者:  Yang, Wei-Tao;  Li, Yong-Hong;  Guo, Ya-Xin;  Zhao, Hao-Yu;  Li, Yang
收藏  |  浏览/下载：26/0  |  提交时间：2021/12/15
Evaluation Method of Heavy-Ion-Induced Single-Event Upset in 3D-Stacked SRAMs 期刊论文
ELECTRONICS, 2020, 卷号: 9, 期号: 8, 页码: 14
作者:  Zhao, Peixiong;  Liu, Tianqi;  Cai, Chang;  He, Ze;  Li, Dongqing
收藏  |  浏览/下载：14/0  |  提交时间：2021/12/15

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