CORC

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CORC

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Impacts of carbon ions on SEU in SOI SRAM 期刊论文
MICROELECTRONICS RELIABILITY, 2021, 卷号: 126, 页码: 6
作者:  Gao, J.;  Zhang, Q.;  Xi, K.;  Li, B.;  Wang, C.
收藏  |  浏览/下载：25/0  |  提交时间：2022/01/24
SEE  SEU  SOI SRAM  C  
X-ray emission produced by interaction of slow highly charged Oq+ ions with Al surfaces 期刊论文
ACTA PHYSICA SINICA, 2021, 卷号: 70, 期号: 19, 页码: 7
作者:  Bing-Zhang, Zhang;  Zhang-Yong, Song;  Xuan, Liu;  Cheng, Qian;  Xin, Fang
收藏  |  浏览/下载：44/0  |  提交时间：2021/12/08
Impact of heavy ion energy and species on single-event upset in commercial floating gate cells 期刊论文
MICROELECTRONICS RELIABILITY, 2021, 卷号: 120, 页码: 6
作者:  Ye, Bing;  Mo, Li-Hua;  Zhai, Peng-Fei;  Cai, Li;  Liu, Tao
收藏  |  浏览/下载：40/0  |  提交时间：2021/12/09
Neutron-induced single event upset simulation in Geant4 for three-dimensional die-stacked SRAM* 期刊论文
CHINESE PHYSICS B, 2021, 卷号: 30, 期号: 3, 页码: 8
作者:  Mo, Li-Hua;  Ye, Bing;  Liu, Jie;  Luo, Jie;  Sun, You-Mei
收藏  |  浏览/下载：33/0  |  提交时间：2021/12/10
Mechanisms of alpha particle induced soft errors in nanoscale static random access memories 期刊论文
ACTA PHYSICA SINICA, 2020, 卷号: 69, 期号: 13, 页码: 9
作者:  Zhang Zhan-Gang;  Ye Bing;  Ji Qing-Gang;  Guo An-Long;  Xi Kai
收藏  |  浏览/下载：10/0  |  提交时间：2022/01/12
Multi-frequency point supported LLRF front-end for CiADS wide-bandwidth application 期刊论文
NUCLEAR SCIENCE AND TECHNIQUES, 2020, 卷号: 31, 期号: 3, 页码: 8
作者:  Chen, Qi;  Gao, Zheng;  Zhu, Zheng-Long;  Xue, Zong-Heng;  He, Yuan
收藏  |  浏览/下载：16/0  |  提交时间：2022/01/18
Analysis and simultion. for Compton camera's imaging resolution 期刊论文
ACTA PHYSICA SINICA, 2019, 卷号: 68, 期号: 11, 页码: 9
作者:  Cai Xiao-Hong;  Song Zhang-Yong;  Yu De-Yang
收藏  |  浏览/下载：52/0  |  提交时间：2019/11/10
Heavy-ion and pulsed-laser single event effects in 130-nm CMOS-based thin/thick gate oxide anti-fuse PROMs 期刊论文
NUCLEAR SCIENCE AND TECHNIQUES, 2019, 卷号: 30, 期号: 5, 页码: 11
作者:  Zhao, Pei-Xiong;  Geng, Chao;  Zhang, Zhan-Gang;  Liu, Jie;  Li, Xiao-Yuan
收藏  |  浏览/下载：60/0  |  提交时间：2019/11/10
The Increased Single-Event Upset Sensitivity of 65-nm DICE SRAM Induced by Total Ionizing Dose 会议论文
Geneva, SWITZERLAND, OCT 02-06, 2017
作者:  Zheng, Qiwen;  Cui, Jiangwei;  Lu, Wu;  Guo, Hongxia;  Liu, Jie
收藏  |  浏览/下载：38/0  |  提交时间：2018/10/08
Anomalous annealing of floating gate errors due to heavy ion irradiation 期刊论文
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2018, 卷号: 418, 页码: 80-86
作者:  Hou, Mingdong;  Zhao, Peixiong;  Luo, Jie;  Ji, Qinggang;  Ye, Bing
收藏  |  浏览/下载：55/0  |  提交时间：2018/05/31

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