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Exploration of vertical scaling limit in carbon nanotube transistors 期刊论文
APPLIED PHYSICS LETTERS, 2016
Qiu, Chenguang; Zhang, Zhiyong; Yang, Yingjun; Xiao, Mengmeng; Ding, Li; Peng, Lian-Mao
收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03
A High-Voltage (> 600 V) N-Island LDMOS With Step-Doped Drift Region in Partial SOI Technology 期刊论文
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2016
Hu, Yue; Wang, Hao; Du, Caixia; Ma, Miaomiao; Chan, Mansun; He, Jin; Wang, Gaofeng
收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03
Too Noisy at the Nanoscale?-The Rise of Random Telegraph Noise (RTN) in Devices and Circuits 其他
2016-01-01
Wang, Runsheng; Guo, Shaofeng; Ren, Pengpeng; Luo, Mulong; Zou, Jibin; Hang, Ru
收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03
Fabrication and optimization of a high speed deep-trench super-junction MOSFET with improved EMI performance 其他
2016-01-01
Fei Wang; Min-Zhi Lin; Yuan-Lin Yuan; Lei Liu; Yuhua Cheng; Peng-Fei Wang
收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03
ESD-reliability characterizations of a 45-V p-channel LDMOS-SCR with the discrete-cathode end 其他
2016-01-01
Chen, Shen-Li; Huang, Yu-Ting; Wu, Yi-Cih; Lin, Jia-Ming; Yang, Chih-Hung; Yen, Chih-Ying; Chen, Kuei-Jyun
收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03
ESD-Reliability Characterizations of a 45-V p-Channel LDMOS-SCR with the Discrete-Cathode End 其他
2016-01-01
Chen, Shen-Li; Huang, Yu-Ting; Wu, Yi-Cih; Lin, Jia-Ming; Yang, Chih-Hung; Yen, Chih-Ying; Chen, Kuei-Jyun
收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03
FSD Protection Design for the 45-V pLDMOS-SCR (p-n-p-Arranged) Devices with Source-Discrete Distributions 其他
2016-01-01
Chen, Shen-Li; Huang, Yu-Ting; Yen, Chih-Ying; Chen, Kuei-Jyun; Wu, Yi-Cih; Lin, Jia-Ming; Yang, Chih-Hung
收藏  |  浏览/下载：6/0  |  提交时间：2017/12/03
High Performance Metal-Gate/High-kappa GaN MOSFET With Good Reliability for Both Logic and Power Applications 期刊论文
IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY, 2016
Yi, Shih-Han; Ruan, Dun-Bao; Di, Shaoyan; Liu, Xiaoyan; Wu, Yung Hsien; Chin, Albert
收藏  |  浏览/下载：8/0  |  提交时间：2017/12/04
Study of impact of LATID on HCI reliability for LDMOS devices 其他
2016-01-01
Chandrashekhar; Sheu, Gene; Yang, Shao Ming; Chien, Ting Yao; Lin, Yun Jung; Wu, Chieh Chih; Lee, Tzu Chieh
收藏  |  浏览/下载：6/0  |  提交时间：2017/12/03
Key characterization factors of accurate power modeling for FinFET circuits 期刊论文
science china information sciences, 2015
Ma KaiSheng; Cui XiaoXin; Liao Kai; Liao Nan; Wu Di; Yu DunShan
收藏  |  浏览/下载：6/0  |  提交时间：2015/11/10

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