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科研机构
北京大学 [16]
内容类型
期刊论文 [11]
其他 [5]
发表日期
2016 [3]
2015 [6]
2013 [1]
2012 [2]
2011 [1]
2010 [1]
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专题:北京大学
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Structural Transitions Induced by Ion Irradiation in V2AlC and Cr2AlC
期刊论文
JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 2016
Wang, Chenxu
;
Yang, Tengfei
;
Xiao, Jingren
;
Liu, Shaoshuai
;
Xue, Jianming
;
Huang, Qing
;
Zhang, Jie
;
Wang, Jingyang
;
Wang, Yugang
收藏
  |  
浏览/下载:7/0
  |  
提交时间:2017/12/03
MAX PHASES
CRYSTALLIZATION KINETICS
M(N+1)AX(N) PHASES
BULK CR2ALC
HEAVY-IONS
THIN-FILMS
TI3SIC2
TI3ALC2
BEHAVIOR
TEMPERATURE
Statistical Analysis on Performance Degradation of 90 nm bulk SiMOS Devices Irradiated by Heavy Ions
其他
2016-01-01
Zhexuan Ren
;
Xia An
;
Weikang Wu
;
Xing Zhang
;
Ru Huang
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2017/12/03
irradiation
saturation
trapped
charges
irradiated
attributed
hardened
intrinsic
leakage
incident
irradiation
saturation
trapped
charges
irradiated
attributed
hardened
intrinsic
leakage
incident
Investigation of a radiation-hardened quasi-SOI device: performance degradation induced by single ion irradiation
期刊论文
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2016
Wu, Weikang
;
An, Xia
;
Que, Taotao
;
Zhang, Xing
;
Shen, Dongjun
;
Guo, Gang
;
Huang, Ru
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2017/12/04
radiation-hardened
quasi-SOI
microdose effect
heavy ion
irradiation
EVENT TRANSIENTS
MOSFETS
IMPACT
TECHNOLOGIES
LOGIC
BULK
Effects of heavy ion irradiation on ultra-deep-submicron partially-depleted SOI devices
期刊论文
半导体学报(英文版), 2015
Wu Weikang
;
An Xia
;
Tan Fei
;
Feng Hui
;
Chen Yehua
;
Liu Jingjing
;
Zhang Xing
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2017/12/03
heavy ion displacement damages PDSOI performance degradation
heavy ion
displacement damages
PDSOI
performance degradation
Heavy ion induced electrical property degradation in sub-100 nm bulk silicon MOS devices
期刊论文
半导体学报(英文版), 2015
Chen Yehua
;
An Xia
;
Wu Weikang
;
Zhang Yao
;
Liu Jingjing
;
Zhang Xing
;
Huang Ru
收藏
  |  
浏览/下载:2/0
  |  
提交时间:2017/12/03
heavy ion displacement damage bulk silicon
heavy ion
displacement damage
bulk silicon
Impact of heavy ion irradiation on CMOS current mirrors based on SOI and bulk Si substrates: mismatch and output impedance
期刊论文
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2015
Wu, Weikang
;
An, Xia
;
Tan, Fei
;
Chen, Yehua
;
Liu, Jingjing
;
Zhang, Yao
;
Zhang, Xing
;
Shen, Dongjun
;
Guo, Gang
;
Huang, Ru
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2017/12/03
current mirrors
heavy ions
damage
mismatch
output impedance
single event
PDSOI
MOSFETS
VARIABILITY
MICRODOSE
CIRCUITS
DEVICES
DESIGN
Line-edge roughness induced single event transient variation in SOI FinFETs
期刊论文
半导体学报(英文版), 2015
Wu Weikang
;
An Xia
;
Jiang Xiaobo
;
Chen Yehua
;
Liu Jingjing
;
Zhang Xing
;
Huang Ru
收藏
  |  
浏览/下载:8/0
  |  
提交时间:2017/12/03
heavy ion irradiation single event transient variation line-edge roughness SOI FinFET
heavy ion irradiation
single event transient
variation
line-edge roughness
SOI
FinFET
Irradiation-induced structural transitions in Ti2AlC
期刊论文
ACTA MATERIALIA, 2015
Wang, Chenxu
;
Yang, Tengfei
;
Xiao, Jingren
;
Liu, Shaoshuai
;
Xue, Jianming
;
Wang, Jingyang
;
Huang, Qing
;
Wang, Yugang
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2017/12/03
MAX phase ceramics
Irradiation effects
Phase transitions
ION IRRADIATION
RADIATION TOLERANCE
MICROSTRUCTURAL CHARACTERIZATION
M(N+1)AX(N) PHASES
TI3ALC2 CERAMICS
DAMAGE EVOLUTION
MAX PHASES
HEAVY-IONS
TI3SIC2
BEHAVIOR
Impact of heavy ion irradiation on CMOS current mirrors based on SOI and bulk Si substrates: mismatch and output impedance
其他
2015-01-01
Wu, Weikang
;
An, Xia
;
Tan, Fei
;
Chen, Yehua
;
Liu, Jingjing
;
Zhang, Yao
;
Zhang, Xing
;
Shen, Dongjun
;
Guo, Gang
;
Huang, Ru
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2017/12/04
current mirrors
heavy ions
damage
mismatch
output impedance
single event
PDSOI
MOSFETS
VARIABILITY
MICRODOSE
CIRCUITS
DEVICES
DESIGN
Investigation on the Response of TaOx-based Resistive Random-Access Memories to Heavy-Ion Irradiation
期刊论文
ieee核科学汇刊, 2013
Tan, Fei
;
Huang, Ru
;
An, Xia
;
Cai, Yimao
;
Pan, Yue
;
Wu, Weikang
;
Feng, Hui
;
Zhang, Xing
;
Wang, YangYuan
收藏
  |  
浏览/下载:2/0
  |  
提交时间:2015/11/10
Heavy-ion irradiation
HRS
LRS
RRAM
DISPLACEMENT DAMAGE
ELECTRICAL CHARACTERISTICS
GALLIUM-ARSENIDE
RADIATION
SEMICONDUCTORS
MEMRISTORS
MOBILITY
DEVICES
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