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科研机构
北京大学 [11]
内容类型
其他 [11]
发表日期
2016 [8]
2015 [2]
2013 [1]
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A Novel Insight into Transient Behaviors of Diode-Triggered SCRs under VF-TLP Testing by 2D/3D Simulations
其他
2016-01-01
Zhang, Lizhong
;
Wang, Yuan
;
He, Yandong
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2017/12/03
electrostatic discharge (ESD)
diode-triggered silicon controlled rectifiers (DTSCRs)
very-fast transmission line pulse (VF-TLP)
transient behaviors
ESD Reliability Improvement of the 0.25-mu m 60-V Power nLDMOS with Discrete Embedded SCRs Separated by STI Structures
其他
2016-01-01
Chen, Shen-Li
;
Wu, Yi-Cih
;
Lin, Jia-Ming
;
Yang, Chih-Hung
;
Yen, Chih-Ying
;
Chen, Kuei-Jyun
;
Chen, Hung-Wei
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2017/12/03
Electrostatic discharge (ESD)
N-channel lateral-diffused MOSFET (nLDMOS)
Secondary breakdown current (I-t2)
Shallow-trench isolation (STI)
Silicon-controller rectifier (SCR)
Design on ESD Robustness of Source-side Discrete Distribution in the 60-V High-Voltage nLDMOS Devices
其他
2016-01-01
Chen, Shen-Li
;
Yang, Chih-Hung
;
Yen, Chih-Ying
;
Chen, Kuei-Jyun
;
Wu, Yi-Cih
;
Lin, Jia-Ming
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2017/12/03
LDMOS
ESD reliability improvement of the 0.25-��m 60-V power nLDMOS with discrete embedded SCRs separated by STI structures
其他
2016-01-01
Chen, Shen-Li
;
Wu, Yi-Cih
;
Lin, Jia-Ming
;
Yang, Chih-Hung
;
Yen, Chih-Ying
;
Chen, Kuei-Jyun
;
Chen, Hung-Wei
收藏
  |  
浏览/下载:6/0
  |  
提交时间:2017/12/03
ESD-reliability characterizations of a 45-V p-channel LDMOS-SCR with the discrete-cathode end
其他
2016-01-01
Chen, Shen-Li
;
Huang, Yu-Ting
;
Wu, Yi-Cih
;
Lin, Jia-Ming
;
Yang, Chih-Hung
;
Yen, Chih-Ying
;
Chen, Kuei-Jyun
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2017/12/03
Design on ESD robustness of source-side discrete distribution in the 60-V high-voltage nLDMOS devices
其他
2016-01-01
Chen, Shen-Li
;
Yang, Chih-Hung
;
Yen, Chih-Ying
;
Chen, Kuei-Jyun
;
Wu, Yi-Cih
;
Lin, Jia-Ming
收藏
  |  
浏览/下载:2/0
  |  
提交时间:2017/12/03
ESD-Reliability Characterizations of a 45-V p-Channel LDMOS-SCR with the Discrete-Cathode End
其他
2016-01-01
Chen, Shen-Li
;
Huang, Yu-Ting
;
Wu, Yi-Cih
;
Lin, Jia-Ming
;
Yang, Chih-Hung
;
Yen, Chih-Ying
;
Chen, Kuei-Jyun
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2017/12/03
P-type laterally-diffused metal oxide semiconductor (pLDMOS)
Electrostatic Discharge (ESD)
Holding voltage (V-h)
Secondary breakdown current (I-t2)
FSD Protection Design for the 45-V pLDMOS-SCR (p-n-p-Arranged) Devices with Source-Discrete Distributions
其他
2016-01-01
Chen, Shen-Li
;
Huang, Yu-Ting
;
Yen, Chih-Ying
;
Chen, Kuei-Jyun
;
Wu, Yi-Cih
;
Lin, Jia-Ming
;
Yang, Chih-Hung
收藏
  |  
浏览/下载:6/0
  |  
提交时间:2017/12/03
Electrostatic-discharge (ESD)
Holding voltage (V-h)
p-channel lateral-diffused MOSFET (pLDMOS)
Secondary breakdown-current (I-1/2)
Silicon controlled rectifier (SCR)
Trigger Voltage (V-t1)
A novel discharge system based on jagged electrodes with controllable spacing
其他
2015-01-01
Yu, Bocheng
;
Han, Mengdi
;
Jiang, Xia
;
Yin, Xiangzhi
;
Zhang, Haixia
收藏
  |  
浏览/下载:2/0
  |  
提交时间:2017/12/03
A Novel Discharge System Based on Jagged Electrodes with Controllable Spacing
其他
2015-01-01
Yu, Bocheng
;
Han, Mengdi
;
Jiang, Xia
;
Yin, Xiangzhi
;
Zhang, Haixia
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2017/12/03
discharge system
air breakdown
high voltage accumulation
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