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Stabilization and Utilization of Coupling MOS Capacitance between TSVs 其他
2016-01-01
Fang, Runiu; Liu, Huan; Miao, Min; Sun, Xin; Jin, Yufeng
收藏  |  浏览/下载:5/0  |  提交时间:2017/12/03
Characteristic research of Zinc Oxide based thin film transistor by ALD technology 其他
2016-01-01
Yukun Yang; Dedong Han; Guodong Cui; Wen Yu; Huijin Li; Junchen Dong; Xing Zhang; Yi Wang; Shengdong Zhang
收藏  |  浏览/下载:2/0  |  提交时间:2017/12/03
EFFECT OF TIME AND TEMPERATURE ON EPITAXY GROWTH 其他
2016-01-01
Aanand; Sheu, Gene; Yang, Shao-Ming; Lai, Ciou-Jhong; Imam, Syed Sarwar
收藏  |  浏览/下载:4/0  |  提交时间:2017/12/03
Effect of time and temperature on epitaxy growth 其他
2016-01-01
Aanand; Sheu, Gene; Yang, Shao-Ming; Lai, Ciou-Jhong; Imam, Syed Sarwar
收藏  |  浏览/下载:3/0  |  提交时间:2017/12/03
Impact of Junction nonabruptness on random-discrete-dopant induced variability in intrinsic channel trigate metal-oxide-semiconductor field-effect transistors 其他
2013-01-01
Wei, Kang Liang; Liu, Xiao Yan; Du, Gang
收藏  |  浏览/下载:5/0  |  提交时间:2017/12/03
Effects of Ionic Doping on the Behaviors of Oxygen Vacancies in HfO(2) and ZrO(2): A First Principles Study 其他
2009-01-01
Zhang, Haowei; Gao, Bin; Yu, Shimeng; Lai, Lin; Zeng, Lang; Sun, Bing; Liu, Lifeng; Liu, Xiaoyan; Lu, Jing; Han, Ruqi; Kang, Jinfeng
收藏  |  浏览/下载:6/0  |  提交时间:2015/11/13
Reliability enhancement in advanced MOSFETS using the U-shape STI structure for radiation appication 其他
2008-01-01
Yunpeng, Pei; Xia, An; Ru, Huang
收藏  |  浏览/下载:3/0  |  提交时间:2015/11/13
Impacts of poly-si gate pre-implanted dopant on the performance and HCI reliability of 65nm nmos device 其他
2008-01-01
Jie, Huang; Yandong, He
收藏  |  浏览/下载:5/0  |  提交时间:2015/11/13
Efficient atomistic method simuation on low energy doping and high temperature annealing technology 其他
2008-01-01
Min, Yu; Huihui, Ji; Li, Yuan; Ming, Li; Ru, Huang; Xing, Zhang
收藏  |  浏览/下载:2/0  |  提交时间:2015/11/13
Simulation of analog/RF performance and process variation in nanowire transistors 其他
2007-01-01
Wang, Runsheng; Zhuge, Jing; Huang, Ru
收藏  |  浏览/下载:2/0  |  提交时间:2017/12/03


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