×
验证码:
换一张
忘记密码?
记住我
CORC
首页
科研机构
检索
知识图谱
申请加入
托管服务
登录
注册
在结果中检索
科研机构
半导体研究所 [12]
内容类型
期刊论文 [9]
会议论文 [3]
发表日期
2011 [1]
2009 [1]
2008 [1]
2007 [1]
2004 [3]
2003 [1]
更多...
学科主题
半导体材料 [12]
×
知识图谱
CORC
开始提交
已提交作品
待认领作品
已认领作品
未提交全文
收藏管理
QQ客服
官方微博
反馈留言
浏览/检索结果:
共12条,第1-10条
帮助
限定条件
学科主题:半导体材料
已选(
0
)
清除
条数/页:
5
10
15
20
25
30
35
40
45
50
55
60
65
70
75
80
85
90
95
100
排序方式:
请选择
作者升序
作者降序
题名升序
题名降序
发表日期升序
发表日期降序
提交时间升序
提交时间降序
The effect of different oriented sapphire substrates on the growth of polar and non-polar ZnMgO by MOCVD
期刊论文
journal of crystal growth, 2011, 卷号: 314, 期号: 1, 页码: 39-42
作者:
Song HP
;
Shi K
;
Sang L
;
Wei HY
收藏
  |  
浏览/下载:58/3
  |  
提交时间:2011/07/05
Metal organic chemical vapor deposition
Sapphire
Zinc compounds
Semiconducting II-VI materials
VAPOR-PHASE EPITAXY
OPTICAL-PROPERTIES
ZNO NANORODS
RAMAN-SCATTERING
M-PLANE
FILMS
PHOTOLUMINESCENCE
DEPOSITION
NANOWIRES
FIELDS
Measurement of polar C-plane and nonpolar A-plane InN/ZnO heterojunctions band offsets by x-ray photoelectron spectroscopy
期刊论文
applied physics letters, 2009, 卷号: 94, 期号: 16, 页码: art. no. 163301
作者:
Jin P
;
Wei HY
;
Song HP
收藏
  |  
浏览/下载:310/47
  |  
提交时间:2010/03/08
conduction bands
III-V semiconductors
II-VI semiconductors
indium compounds
interface states
polarisation
semiconductor heterojunctions
valence bands
wide band gap semiconductors
X-ray photoelectron spectra
zinc compounds
Effect of Nitridation on Morphology, Structural Properties and Stress of AIN Films
期刊论文
chinese physics letters, 2008, 卷号: 25, 期号: 12, 页码: 4364-4367
作者:
Wei HY
;
Jiao CM
收藏
  |  
浏览/下载:178/45
  |  
提交时间:2010/03/08
TRANSMISSION ELECTRON-MICROSCOPY
WURTZITE-TYPE CRYSTALS
VAPOR-PHASE EPITAXY
INTRINSIC STRESS
SAPPHIRE SURFACE
THIN-FILMS
GAN
GROWTH
DIFFRACTION
MECHANISM
Using different carrier gases to control AlN film stress and the effect on morphology, structural properties and optical properties
期刊论文
journal of physics d-applied physics, 2007, 卷号: 40, 期号: 23, 页码: 7462-7466
Hu, WG
;
Liu, XL
;
Jiao, CM
;
Wei, HY
;
Kang, TT
;
Zhang, PF
;
Zhang, RQ
;
Fan, HB
;
Zhu, QS
收藏
  |  
浏览/下载:55/4
  |  
提交时间:2010/03/08
VAPOR-PHASE EPITAXY
WURTZITE-TYPE CRYSTALS
THIN-FILMS
ALUMINUM NITRIDE
INTRINSIC STRESS
GAN
SAPPHIRE
AIN
DEPOSITION
STRAIN
Effects of polarization field on formation of two-dimensional electron gas in (0001) and (11(2)over-bar0) plane AlGaN/GaN heterostructures
期刊论文
journal of crystal growth, 2004, 卷号: 268, 期号: 3-4, 页码: 504-508
Chen, Z
;
Chua, SJ
;
Yuan, HR
;
Liu, XL
;
Lu, DC
;
Han, PD
;
Wang, ZG
收藏
  |  
浏览/下载:269/35
  |  
提交时间:2010/03/09
metalorganic chemical vapor deposition
Investigation of GaAs/AlGaAs interfaces by reflectance-difference spectroscopy
会议论文
10th international conference on defects - recognition, imaging and physics in semiconductors (drip 10), batz sur mer, france, sep 29-oct 02, 2003
作者:
Ye XL
;
Xu B
收藏
  |  
浏览/下载:11/0
  |  
提交时间:2010/10/29
SHORT-PERIOD SUPERLATTICES
RAMAN-SCATTERING
QUANTUM-WELLS
GROWTH
ROUGHNESS
SEGREGATION
ALAS/GAAS
ALAS
GAAS
Effects of polarization field on formation of two-dimensional electron gas in (0001) and (11(2)over-bar0) plane AlGaN/GaN heterostructures
会议论文
international conference on materials for advanced technologies, singapore, singapore, dec 07-12, 2003
作者:
Han PD
收藏
  |  
浏览/下载:83/1
  |  
提交时间:2010/10/29
metalorganic chemical vapor deposition
semiconducting III-V materials
DOPED AL(X)GA1-XN/GAN HETEROSTRUCTURES
CARRIER CONFINEMENT
EFFECT TRANSISTORS
PHOTOLUMINESCENCE
MOBILITY
HETEROJUNCTION
INTERFACE
HFETS
Epitaxial growth and characterization of SiC on C-plane sapphire substrates by ammonia nitridation
期刊论文
journal of crystal growth, 2003, 卷号: 249, 期号: 1-2, 页码: 1-8
Luo MC
;
Li JM
;
Wang QM
;
Sun GS
;
Wang L
;
Li GR
;
Zeng YP
;
Lin LY
收藏
  |  
浏览/下载:47/0
  |  
提交时间:2010/08/12
infrared reflectivity
Raman
sapphire substrate
X-ray diffraction
chemical vapor deposition
SiC
GAN
FILMS
Epitaxial growth of SiC on complex substrates
会议论文
11th international conference on molecular beam epitaxy (mbe-xi), beijing, peoples r china, sep 11-15, 2000
Sun GS
;
Li JM
;
Luo MC
;
Zhu SR
;
Wang L
;
Zhang FF
;
Lin LY
收藏
  |  
浏览/下载:15/0
  |  
提交时间:2010/11/15
optical microscopy
X-ray diffraction
molecular beam epitaxy
semiconducting silicon compounds
SAPPHIRE
DEPOSITION
FILMS
X-Ray diffraction determination of the fractions of hexagonal and twinned phases in cubic GaN layers grown on (001)GaAs substrate
期刊论文
thin solid films, 2001, 卷号: 392, 期号: 1, 页码: 29-33
Qu B
;
Zheng XH
;
Wang YT
;
Feng ZH
;
Liu SA
;
Lin SM
;
Yang H
;
Liang JW
收藏
  |  
浏览/下载:102/13
  |  
提交时间:2010/08/12
gallium nitride
X-ray diffraction
EPITAXY
RATIO
©版权所有 ©2017 CSpace - Powered by
CSpace