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科研机构
半导体研究所 [13]
内容类型
期刊论文 [11]
会议论文 [2]
发表日期
2011 [1]
2006 [1]
2004 [2]
2003 [1]
2002 [2]
2001 [3]
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学科主题
半导体材料 [13]
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Defect-related emission characteristics of nonpolar m-plane GaN revealed by selective etching
期刊论文
journal of crystal growth, 2011, 卷号: 314, 期号: 1, 页码: 141-145
作者:
Duan RF
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  |  
浏览/下载:84/4
  |  
提交时间:2011/07/05
CL
PL
Stacking fault
HVPE
GaN
Nonpolar
CHEMICAL-VAPOR-DEPOSITION
ACCEPTOR PAIR EMISSION
PHASE EPITAXY
GROWN GAN
SEMICONDUCTORS
SAPPHIRE
FILMS
NITRIDE
Nanoelectronic devices-resonant tunnelling diodes grown on InP substrates by molecular beam epitaxy with peak to valley current ratio of 17 at room temperature
期刊论文
chinese physics, 2006, 卷号: 15, 期号: 6, 页码: 1335-1338
作者:
Zhang Y
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  |  
浏览/下载:46/0
  |  
提交时间:2010/04/11
resonant tunnelling diode
InP substrate
molecular beam epitaxy
high resolution transmission electron microscope
CURRENT-VOLTAGE CHARACTERISTICS
INTRINSIC BISTABILITY
CIRCUIT
Microstructural and compositional characteristics of GaN films grown on a ZnO-buffered Si(111) wafer
期刊论文
micron, 2004, 卷号: 35, 期号: 6, 页码: 475-480
Luo, XH
;
Wang, RM
;
Zhang, XP
;
Zhang, HZ
;
Yu, DP
;
Luo, MC
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  |  
浏览/下载:145/32
  |  
提交时间:2010/03/09
transmission electron microscopy
electron energy loss spectroscopy
molecular beam epitaxy
gallium nitride
CHEMICAL-VAPOR-DEPOSITION
EPITAXY
LAYER
Microstructural and compositional characteristics of GaN films grown on a ZnO-buffered Si(111) wafer
会议论文
international wuhan symposium on advanced electron microscopy (iwsaem), wuhan, peoples r china, oct 17-21, 2003
Luo XH
;
Wang RM
;
Zhang XP
;
Zhang HZ
;
Yu DP
;
Luo MC
收藏
  |  
浏览/下载:18/1
  |  
提交时间:2010/10/29
transmission electron microscopy
electron energy loss spectroscopy
molecular beam epitaxy
gallium nitride
CHEMICAL-VAPOR-DEPOSITION
EPITAXY
LAYER
Structure characteristics of InGaN quantum dots fabricated by passivation and low temperature method
期刊论文
journal of crystal growth, 2003, 卷号: 252, 期号: 1-3, 页码: 19-25
Qu BZ
;
Chen Z
;
Lu DC
;
Han P
;
Liu XG
;
Wang XH
;
Wang D
;
Zhu QS
;
Wang ZG
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  |  
浏览/下载:37/0
  |  
提交时间:2010/08/12
nanostructures
metalorganic chemical vapor deposition
nitrides
CHEMICAL-VAPOR-DEPOSITION
MOLECULAR-BEAM EPITAXY
SIZE DISTRIBUTION
GROWTH
GAAS
DEPENDENCE
EMISSION
NUMBER
Statistical investigation on morphology development of gallium nitride in initial growth stage
期刊论文
journal of crystal growth, 2002, 卷号: 234, 期号: 1, 页码: 77-84
Yuan HR
;
Lu DC
;
Liu XL
;
Chen Z
;
Han P
;
Wang XH
;
Wang D
收藏
  |  
浏览/下载:76/3
  |  
提交时间:2010/08/12
atomic force microscopy
crystal morphology
organic vapor phase epitaxy
nitrides
CHEMICAL-VAPOR-DEPOSITION
AIN BUFFER LAYER
GAN
SAPPHIRE
ALN
EPITAXY
MOVPE
Influence of combined InAlAs and InGaAs strain-reducing laser on luminescence properties of InAs/GaAs quantum dots
期刊论文
journal of crystal growth, 2002, 卷号: 234, 期号: 2-3, 页码: 354-358
作者:
Xu B
;
Jiang DS
;
Wang ZG
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  |  
浏览/下载:84/7
  |  
提交时间:2010/08/12
nanostructures
molecular beam epitaxy
semiconductor III-V materials
laser diodes
1.3 MU-M
CONTINUOUS-WAVE OPERATION
TEMPERATURE-DEPENDENCE
LASING CHARACTERISTICS
1.3-MU-M
PHOTOLUMINESCENCE
GAIN
Homoepitaxial growth and device characteristics of SiC on Si-face (0001) 6H-SiC
会议论文
11th international conference on molecular beam epitaxy (mbe-xi), beijing, peoples r china, sep 11-15, 2000
Li JM
;
Sun GS
;
Zhu SR
;
Wang L
;
Luo MC
;
Zhang FF
;
Lin LY
收藏
  |  
浏览/下载:10/0
  |  
提交时间:2010/11/15
X-ray diffraction
molecular beam epitaxy
semiconducting silicon compounds
LOW-TEMPERATURE GROWTH
FILMS
Homoepitaxial growth and device characteristics of SiC on Si-face (0001) 6H-SiC
期刊论文
journal of crystal growth, 2001, 卷号: 227, 期号: 0, 页码: 816-819
Li JM
;
Sun GS
;
Zhu SR
;
Wang L
;
Luo MC
;
Zhang FF
;
Lin LY
收藏
  |  
浏览/下载:79/6
  |  
提交时间:2010/08/12
X-ray diffraction
molecular beam epitaxy
semiconducting silicon compounds
LOW-TEMPERATURE GROWTH
FILMS
Structural characterization of cubic GaN grown on GaAs(001) substrates
期刊论文
chinese journal of electronics, 2001, 卷号: 10, 期号: 2, 页码: 219-222
Zheng XH
;
Qu B
;
Wang YT
;
Yang H
;
Liang JW
;
Han JY
收藏
  |  
浏览/下载:93/4
  |  
提交时间:2010/08/12
cubic GaN
X-ray double crystal diffraction
structural characteristics
CONTINUOUS-WAVE OPERATION
EPITAXIAL-GROWTH
HEXAGONAL GAN
LASER-DIODES
THIN-FILMS
MBE
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