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THE EQUILIBRATION BEHAVIOR OF DEFECTS IN BORON DOPED HYDROGENATED AMORPHOUS SILICON-CARBON FILMS DURING THE ANNEALING PROCESS 期刊论文
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1991, 卷号: 126, 期号: 2, 页码: K99-K103
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Boron depth profiles in a-Si1-xCx:H(B) films after thermal annealing 会议论文
Shanghai, China, April 15, 1991 - April 17, 1991
作者:  Liao, Chang G.;  Zheng, Zhi H.;  Wang, Yong Q.;  Yang, Sheng S.
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DEPTH PROFILES OF BORON IN IPI AMORPHOUS-SILICON FILMS WITH (P,ALPHA) RESONANCE REACTION 期刊论文
VACUUM, 1991, 卷号: 42, 期号: 8-9, 页码: 533-535
作者:  LIAO, CG;  ZHENG, ZH;  WANG, YQ;  JIANG, BY
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STUDY OF BORON DEPTH PROFILES IN IPI AMORPHOUS-SILICON FILMS AFTER THERMAL ANNEALING USING THE (P,ALPHA) REACTION 期刊论文
VACUUM, 1991, 卷号: 42, 期号: 17, 页码: 1129-1132
作者:  LIAO, CG;  ZHENG, ZH;  WANG, YQ;  YANG, SS;  JIANG, H
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Boron depth profiles in a-Si1-xCx:H(B) films after thermal annealing 会议论文
1991 International Conference on Thin Film Physics and Applications, Shanghai, China, April 15, 1991 - April 17, 1991
作者:  Liao, Changgeng;  Zheng, Zhihao;  Wang, Yongqiang;  Yang, Shengsheng
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