The Development and Prospect of Surface Defect Detection Based on Vision Measurement Method | |
Yuan LX(袁伦喜); Zhang ZT(张正涛); Tao X(陶显) | |
2016-12 | |
会议日期 | 2016.05.12-2016.05.15 |
会议地点 | 中国桂林 |
关键词 | Defect Detect Vision Measurement |
英文摘要 |
Surface defects detection techniques are widely used and play very important roles in many fields, such as precision optical element used in high energy laser, wafer used in semiconductor, cover glass used in mobile phone, etc. This paper introduced the research progress in surface defect detection based on vision measurement, analyzed the significant and application of detecting the surface defect by using vision measurement, summarized the main work of this technology, and analyzed the key points and challenges in the application of these techniques. At last, this paper outlines the prospect and the direction for the surface defect detection based on vision measurement. |
语种 | 英语 |
内容类型 | 会议论文 |
源URL | [http://ir.ia.ac.cn/handle/173211/14558] |
专题 | 精密感知与控制研究中心_精密感知与控制 |
作者单位 | 中国科学院自动化研究所 |
推荐引用方式 GB/T 7714 | Yuan LX,Zhang ZT,Tao X. The Development and Prospect of Surface Defect Detection Based on Vision Measurement Method[C]. 见:. 中国桂林. 2016.05.12-2016.05.15. |
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