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CORC

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Extra source implantation for suppression floating-body effect in partially depleted SOI MOSFETs 期刊论文
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2012, 卷号: 272, 页码: 128-131
Chen, J; Luo, JX; Wu, QQ; Chai, Z; Huang, XL; Wei, X; Wang, X
收藏  |  浏览/下载：17/0  |  提交时间：2013/04/17
A Tunnel Diode Body Contact Structure for High-Performance SOI MOSFETs 期刊论文
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2012, 卷号: 59, 期号: 1, 页码: 101-107
Luo, JX; Chen, J; Wu, QQ; Chai, Z; Zhou, JH; Yu, T; Dong, YJ; Li, L; Liu, W; Qiu, C; Wang, X
收藏  |  浏览/下载：13/0  |  提交时间：2013/04/17
Development of wafer level glass frit bonding by using barrier trench technology and precision screen printing 期刊论文
MICROELECTRONIC ENGINEERING, 2012, 卷号: 100, 页码: 6-11
Chen, X; Yan, PL; Tang, JJ; Xu, GW; Luo, L
收藏  |  浏览/下载：12/0  |  提交时间：2013/04/23
A Novel Wafer-level Metal/BCB Interconnection between Both Sides of Wafer Using TSV and Its Microwave Performance 期刊论文
2012 IEEE 62ND ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC), 2012, 页码: 2121-2128
Tang, JJ; Chen, X; Xu, GW; Luo, L
收藏  |  浏览/下载：12/0  |  提交时间：2013/04/23
Experimental Demonstration of the High-Performance Floating-Body/Gate DRAM Cell for Embedded Memories 期刊论文
IEEE ELECTRON DEVICE LETTERS, 2012, 卷号: 33, 期号: 6, 页码: 743-745
Wu, QQ; Chen, J; Lu, ZC; Zhou, ZM; Luo, JX; Chai, Z; Yu, T; Qiu, C; Li, L; Pang, A; Wang, X; Fossum, JG
收藏  |  浏览/下载：14/0  |  提交时间：2013/04/17
TDBC SOI technology to suppress floating body effect in PD SOI p-MOSFETs 期刊论文
ELECTRONICS LETTERS, 2012, 卷号: 48, 期号: 11, 页码: 652-653
Luo, JX; Chen, J; Wu, QQ; Chai, Z; Yu, T; Wang, X
收藏  |  浏览/下载：16/0  |  提交时间：2013/04/17
Impact of back-gate bias on the hysteresis effect in partially depleted SOI MOSFETs 期刊论文
CHINESE PHYSICS B, 2012, 卷号: 21, 期号: 5, 页码: 56602
Luo, JX; Chen, J; Zhou, JH; Wu, QQ; Chai, Z; Yu, T; Wang, X
收藏  |  浏览/下载：18/0  |  提交时间：2013/04/17
Temperature Dependence of Hysteresis Effect in Partially Depleted Silicon-on-Insulator MOSFETs 期刊论文
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2012, 卷号: 12, 期号: 1, 页码: 63-67
Luo, JX; Chen, J; Zhou, JH; Wu, QQ; Chai, Z; Wang, X
收藏  |  浏览/下载：12/0  |  提交时间：2013/04/17
TDBC SOI technology to suppress floating body effect in PD SOI p-MOSFETs 期刊论文
ELECTRONICS LETTERS, 2012, 卷号: 48, 期号: 11, 页码: 652-653
Luo, JX; Chen, J; Wu, QQ; Chai, Z; Yu, T; Wang, X（重点实验室）
收藏  |  浏览/下载：7/0  |  提交时间：2013/05/10
Temperature Dependence of Hysteresis Effect in Partially Depleted Silicon-on-Insulator MOSFETs 期刊论文
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2012, 卷号: 12, 期号: 1, 页码: 63-67
Luo, JX; Chen, J; Zhou, JH; Wu, QQ; Chai, Z; Wang, X（重点实验室）
收藏  |  浏览/下载：9/0  |  提交时间：2013/05/10

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