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CORC

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Reliability investigation of high-k/metal gate in nMOSFETs by three-dimensional kinetic Monte-Carlo simulation with multiple trap interactions 其他
2016-01-01
Li, Yun; Jiang, Hai; Lun, Zhiyuan; Wang, Yijiao; Huang, Peng; Hao, Hao; Du, Gang; Zhang, Xing; Liu, Xiaoyan
收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03
Fabrication and Characterization of Low Stress Si Interposer with Air-gapped Si Interconnection for Hermetical System-in-Package 其他
2016-01-01
Luo, Rongfeng; Ren, Kuili; Ma, Shenglin; Yan, Jun; Xia, Yanming; Jin, Yufeng; Chen, Jing; Wu, Tianzhun; Yang, Hangao; Yuan, Lifang
收藏  |  浏览/下载：5/0  |  提交时间：2017/12/03
Design and Characterization of Petaloid Hollow Cu Interconnection for Interposer 其他
2016-01-01
Xia, Yanming; Ren, Kuili; Ma, Shenglin; Guan, Yong; Cai, Han; Luo, Rongfeng; Yan, Jun; Chen, Jing; Jin, Yufeng
收藏  |  浏览/下载：6/0  |  提交时间：2017/12/03
Analysis of Self-heating Effect in a SOI LDMOS Device under an ESD Stress 其他
2016-01-01
Tianxing Li; Jian Cao; Lizhong Zhang; Yuan Wang
收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03
Study of impact of LATID on HCI reliability for LDMOS devices 其他
2016-01-01
Chandrashekhar; Sheu, Gene; Yang, Shao Ming; Chien, Ting Yao; Lin, Yun Jung; Wu, Chieh Chih; Lee, Tzu Chieh
收藏  |  浏览/下载：6/0  |  提交时间：2017/12/03
High temperature pressure sensor using a thermostable electrode 其他
2015-01-01
Liu, G.D.; Cui, W.P.; Hu, H.; Zhang, F.S.; Zhang, Y.X.; Gao, C.C.; Hao, Y.L.
收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03
Investigation of stress rupture properties of micro beams using the piezoresistive effect 其他
2015-01-01
Guan, Taotao; Yang, Fang; Wang, Wei; Huang, Xian; He, Jun; Zhang, Li; Fu, Fengshan; Li, Rui; Zhang, Dacheng
收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03
Investigation of Stress Rupture Properties of Micro Beams using the Piezoresistive Effect 其他
2015-01-01
Guan, Taotao; Yang, Fang; Wang, Wei; Huang, Xian; He, Jun; Zhang, Li; Fu, Fengshan; Li, Rui; Zhang, Dacheng
收藏  |  浏览/下载：5/0  |  提交时间：2017/12/03
Methodology of Micro-accelerometer Reliability 其他
2013-01-01
Jia, Yubin; Huang, Qingwen
收藏  |  浏览/下载：3/0  |  提交时间：2015/11/13
A monitoring circuit for NBTI degradation at 65nm technology node 其他
2013-01-01
He, Yandong; Hong, Jie; Zhang, Ganggang; Han, Lin; Zhang, Xing
收藏  |  浏览/下载：3/0  |  提交时间：2015/11/13

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