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科研机构
半导体研究所 [46]
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期刊论文 [40]
会议论文 [6]
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2011 [1]
2009 [2]
2008 [3]
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2006 [4]
2005 [1]
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半导体材料 [46]
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Growth of GaN film on Si (111) substrate using AlN sandwich structure as buffer
期刊论文
journal of crystal growth, 2011, 卷号: 318, 期号: 1, 页码: 464-467
作者:
Pan X
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浏览/下载:81/5
  |  
提交时间:2011/07/05
Sandwich structure
Stress
Aluminum nitride
Gallium nitride
Silicon
PHONON DEFORMATION POTENTIALS
WURTZITE ALN
SILICON
STRESS
TRANSISTORS
EPITAXY
LAYERS
Narrowing of band gap and low-temperature spin glass behavior of FeNi co-doped ZnO nanowires
期刊论文
epl, 2009, 卷号: 87, 期号: 5, 页码: art. no. 57004
Iqbal J
;
Liu XF
;
Majid A
;
Yu DP
;
Yu RH
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浏览/下载:92/34
  |  
提交时间:2010/03/08
ROOM-TEMPERATURE
PHOTOLUMINESCENCE
FERROMAGNETISM
FILMS
SPINTRONICS
PRINCIPLES
Measurement of polar C-plane and nonpolar A-plane InN/ZnO heterojunctions band offsets by x-ray photoelectron spectroscopy
期刊论文
applied physics letters, 2009, 卷号: 94, 期号: 16, 页码: art. no. 163301
作者:
Jin P
;
Wei HY
;
Song HP
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浏览/下载:310/47
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提交时间:2010/03/08
conduction bands
III-V semiconductors
II-VI semiconductors
indium compounds
interface states
polarisation
semiconductor heterojunctions
valence bands
wide band gap semiconductors
X-ray photoelectron spectra
zinc compounds
Investigation of native defects and property of bulk ZnO single crystal grown by a closed chemical vapor transport method
期刊论文
journal of crystal growth, 2008, 卷号: 310, 期号: 3, 页码: 639-645
Wei, XC
;
Zhao, YW
;
Dong, ZY
;
Li, JM
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  |  
浏览/下载:51/0
  |  
提交时间:2010/03/08
defects
X-ray diffraction
growth from vapor
oxides
semiconducting II-VI materials
Effect of indium-doped interlayer on the strain relief in GaN films grown on Si(111)
期刊论文
physica status solidi a-applications and materials science, 2008, 卷号: 205, 期号: 2, 页码: 294-299
Wu, JJ
;
Zhao, LB
;
Zhang, GY
;
Liu, XL
;
Zhu, QS
;
Wang, ZG
;
Jia, QJ
;
Guo, LP
;
Hu, TD
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  |  
浏览/下载:65/3
  |  
提交时间:2010/03/08
CHEMICAL-VAPOR-DEPOSITION
TEMPERATURE ALN INTERLAYERS
PHASE EPITAXY
OPTICAL-PROPERTIES
SURFACTANT
SUBSTRATE
STRESS
SI
REDUCTION
SAPPHIRE
Valence band offset of InN/4H-SiC heterojunction measured by x-ray photoelectron spectroscopy
期刊论文
applied physics letters, 2008, 卷号: 93, 期号: 24, 页码: art. no. 242107
Zhang BL
;
Sun GS
;
Guo Y
;
Zhang PF
;
Zhang RQ
;
Fan HB
;
Liu XL
;
Yang SY
;
Zhu QS
;
Wang ZG
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  |  
浏览/下载:231/42
  |  
提交时间:2010/03/08
conduction bands
III-V semiconductors
indium compounds
interface states
semiconductor heterojunctions
silicon compounds
valence bands
wide band gap semiconductors
X-ray photoelectron spectra
InAs0.3Sb0.7 films grown on (100) GaSb substrates with a buffer layer by liquid-phase epitaxy
期刊论文
journal of crystal growth, 2007, 卷号: 304, 期号: 2, 页码: 472-475
Gao FB (Gao Fubao)
;
Chen NF (Chen NuoFu)
;
Liu L (Liu Lei)
;
Zhang XW (Zhang X. W.)
;
Wu JL (Wu Jinliang)
;
Yin ZG (Yin Zhigang)
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  |  
浏览/下载:37/0
  |  
提交时间:2010/03/29
crystal structure
High-precision determination of lattice constants and structural characterization of InN thin films
期刊论文
journal of vacuum science & technology a, 2006, 卷号: 24, 期号: 2, 页码: 275-279
Wu MF
;
Zhou SQ
;
Vantomme A
;
Huang Y
;
Wang H
;
Yang H
收藏
  |  
浏览/下载:108/0
  |  
提交时间:2010/04/11
X-RAY-DIFFRACTION
BAND-GAP
EPITAXIAL LAYERS
INDIUM NITRIDE
HEXAGONAL INN
CUBIC INN
GROWTH
PARAMETERS
INGAN
PHASE
Hydrogenated p-type nanocrystalline silicon in amorphous silicon solar cells
期刊论文
journal of non-crystalline solids, 2006, 卷号: 352, 期号: 9-20, 页码: 1900-1903
Hu ZH (Hu Zhihua)
;
Liao XB (Liao Xianbo)
;
Diao HW (Diao Hongwei)
;
Cai Y (Cai Yi)
;
Zhang SB (Zhang Shibin)
;
Fortunato E (Fortunato Elvira)
;
Martins R (Martins Rodrigo)
收藏
  |  
浏览/下载:59/0
  |  
提交时间:2010/04/11
silicon
solar cells
photovoltaics
Raman scattering
MICROCRYSTALLINE SILICON
SI NANOCRYSTALS
VOLUME FRACTION
RAMAN
CRYSTALLINITY
FILMS
Optical and structural properties of ZnO films grown on Si(100) substrates by MOCVD - art. no. 60290G
会议论文
20th congress of the international-commission-for-optics, changchun, peoples r china, aug 21-26, 2005
Shen, WJ
;
Duan, Y
;
Wang, J
;
Wang, QY
;
Zeng, YP
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  |  
浏览/下载:95/18
  |  
提交时间:2010/03/29
ZnO
MOCVD
thermal annealing
photoluminescence
x-ray diffraction
atomic force microscopy
PULSED-LASER DEPOSITION
THIN-FILMS
PHOTOLUMINESCENCE
MECHANISMS
EPITAXY
CVD
SI
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