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Effect of implanting silicon in buried oxide on the radiation hardness of the partially-depleted CMOS/SOI 期刊论文
ICSICT-2006: 2006 8th International Conference on Solid-State and Integrated Circuit Technology, Proceedings, ICSICT-2006: 2006 8th International Conference on Solid-State and Integrated Circuit Technology, Proceedings, 2007, p 215-217, 2007, 页码: 215-217
He, Wei (Shanghai Institute of Microsystems and Information Technology, Chinese Academy of Sciences); Zhang, Zheng-Xuan; Zhang, En-Xia; Qian, Cong; Tian, Hao; Wang Xi
收藏  |  浏览/下载:14/0  |  提交时间:2012/05/31
Effect of nitrogen implantation technologies on total dose rad-hardness of SIMON materials 期刊论文
Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors, 2005, 卷号: 26, 期号: 6, 页码: 1269-1272
Zhang, Enxia1; Qian, Cong1; Zhang, Zhengxuan1; Wang, Xi1; Zhang, Guoqiang2; Li, Ning2; Zheng, Zhongshan2; Liu, Zhongli2
收藏  |  浏览/下载:20/0  |  提交时间:2012/03/24
Optimal transitions in beta-FeSi2 films 期刊论文
PHYSICAL REVIEW B, 1996, 卷号: 54, 期号: 16, 页码: 11126-11128
Wang,LW; Ostling,M; Yang,K; Qin,LH; Lin,CL; Chen,XD; Zou,SC; Zheng,YX; Qian,YH
收藏  |  浏览/下载:14/0  |  提交时间:2012/03/25
Analysis of implantation-induced damage and amorphization of GaSb 期刊论文
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1996, 卷号: 157, 期号: 1, 页码: 57-63
Zheng, YX; Chen, LY; Zhou, SM; Wang, YD; Qian, YH; Lin, CL; He, ZP; Zheng, AS; Li, JM
收藏  |  浏览/下载:14/0  |  提交时间:2012/03/25
CHARACTERISTICS OF HIGH-ENERGY N+-IMPLANTED DAMAGE IN GASB 期刊论文
SOLID STATE COMMUNICATIONS, 1995, 卷号: 96, 期号: 8, 页码: 593-596
ZHENG, YX; QIAN, YH; CHEN, LY; ZHOU, SM; WANG, YD; LIN, CL; HE, ZP; ZHENG, AS
收藏  |  浏览/下载:9/0  |  提交时间:2012/03/25


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