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A Physical Model for the Statistics of the Set Switching Time of Resistive RAM Measured with the Width-Adjusting Pulse Operation Method 期刊论文
IEEE Electron Device Letters, 2015
作者:  Zhang MY(张美芸);  Yu ZA(余兆安);  Li Y(李阳);  Xu DL(许定林);  Lv HB(吕杭炳)
收藏  |  浏览/下载:17/0  |  提交时间:2016/05/24
Improving resistance uniformity and endurance of resistive switching memory by accurately controlling the stress time of pulse program operation 期刊论文
Appl. Phys. Lett., 2015
作者:  Xu DL(许定林);  Wang GM(王国明);  Long SB(龙世兵);  Yu ZA(余兆安);  Zhang MY(张美芸)
收藏  |  浏览/下载:14/0  |  提交时间:2016/05/24
Investigation of LRS dependence on the retention of HRS in CBRAM 期刊论文
Nanoscale Research Letters, 2015
作者:  Lv HB(吕杭炳);  Xu XX(许晓欣);  Liu HT(刘红涛);  Luo Q(罗庆);  Gong TC(龚天成)
收藏  |  浏览/下载:8/0  |  提交时间:2016/05/24
Impact of program/erase operation on the performances of oxide-based resistive switching memory 期刊论文
Nanoscale Research Letters, 2015
作者:  Wang GM(王国明);  Long SB(龙世兵);  Yu ZA(余兆安);  Zhang MY(张美芸);  Li Y(李阳)
收藏  |  浏览/下载:9/0  |  提交时间:2016/05/24
Set statistics in conductive bridge random access memory device 期刊论文
Applied Physics Letters, 2014
作者:  Li Y(李阳);  Liu Q(刘琦);  Lv HB(吕杭炳);  Xu XX(许晓欣);  Liu M(刘明)
收藏  |  浏览/下载:16/0  |  提交时间:2015/04/14
An overview of the switching parameter variation of RRAM 期刊论文
Chin. Sci. Bull., 2014
作者:  Wang GM(王国明);  Sun PX(孙鹏霄);  Sun HT(孙海涛);  Liu Q(刘琦);  Lv HB(吕杭炳)
收藏  |  浏览/下载:12/0  |  提交时间:2015/04/14


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