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Comprehensive understanding of the effect of electric dipole at high-k/SiO2 interface on the flatband voltage shift in metal-oxide-semiconductor device 外文期刊
2010
作者:  Han, K;  Wang, WW;  Ma, XL;  Chen, DP;  Zhang, J
收藏  |  浏览/下载:22/0  |  提交时间:2010/11/26
Effect of Al-diffusion-induced positive flatband voltage shift on the electrical characteristics of Al-incorporated high-k metal-oxide-semiconductor field-effective transistor 外文期刊
2009
作者:  Toriumi, A;  Ota, H;  Nabatame, T;  Mizubayashi, W;  Akiyama, K
收藏  |  浏览/下载:14/0  |  提交时间:2010/11/26
Structure optimization of field-plate AlGaN/GaN HEMTs 外文期刊
2007
作者:  Luo, WJ;  Wei, K;  Chen, XJ;  Li, CZ;  Liu, XY
收藏  |  浏览/下载:10/0  |  提交时间:2010/11/26
Effect of the technology of implanting nitrogen into buried oxide on the radiation hardness of the top gate oxide for partially depleted SOIPMOSFET 外文期刊
2005
作者:  Zheng, ZS;  Liu, ZL;  Zhang, GQ;  Li, N;  Fan, K
收藏  |  浏览/下载:11/0  |  提交时间:2010/11/26
Effects of techniques of implanting nitrogen into buried oxide on the characteristics of partially depleted SOIPMOSFET 外文期刊
2005
作者:  Zheng, ZS;  Liu, ZL;  Zhang, GQ;  Li, N;  Fan, K
收藏  |  浏览/下载:7/0  |  提交时间:2010/11/26
The reactive ion etching of Bi2Ti2O7 thin films on silicon substrates and its image in atomic force microscopy 外文期刊
2002
作者:  Wang, Z;  Sun, DL;  Hu, JF;  Cui, DL;  Xu, XH
收藏  |  浏览/下载:16/0  |  提交时间:2010/11/26


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