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A single event transient detector in SRAM-based FPGAs 期刊论文
IEICE ELECTRONICS EXPRESS, 2017, 卷号: Vol.14 No.12
作者:  Liang,Huaguo;  Ni,Tianming;  Xu,Xiumin;  Yi,Maoxiang;  Lu,Yingchun
收藏  |  浏览/下载:9/0  |  提交时间:2019/04/22
Double-Node-Upset-Resilient Latch Design for Nanoscale CMOS Technology 期刊论文
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2017, 卷号: Vol.25 No.6, 页码: 1978-1982
作者:  Liang,Huaguo;  Xu,Xiumin;  Yi,Maoxiang;  Yan,Aibin;  Ouyang,Yiming
收藏  |  浏览/下载:3/0  |  提交时间:2019/04/22
HLDTL: High-performance, low-cost, and double node upset tolerant latch design 期刊论文
Proceedings of the IEEE VLSI Test Symposium, 2017
作者:  Liang,Huaguo;  Yi,Maoxiang;  Cui,Jie;  Yan,Aibin;  Huang,Zhengfeng
收藏  |  浏览/下载:12/0  |  提交时间:2019/04/22


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