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Effects of stress-loading test methods on the degradation of light-emitting diode modules 期刊论文
2016, 卷号: 64, 页码: 635-639
作者:  Cai, Miao[1];  Yang, Daoguo[1];  Zheng, Jianna[1];  Huang, Jianlin[2];  Liu, Dongjing[1]
收藏  |  浏览/下载:3/0  |  提交时间:2019/11/30
Thermal degradation kinetics of LED lamps in step-up-stress and step-down-stress accelerated degradation testing 期刊论文
2016, 卷号: 107, 页码: 918-926
作者:  Cai, Miao[1];  Yang, Daoguo[1];  Zheng, Jianna[1];  Mo, Yuezhu[1];  Huang, Jianlin[2]
收藏  |  浏览/下载:5/0  |  提交时间:2019/11/30
Effects of stress-loading test methods on the degradation of light-emitting diode modules 会议论文
Halle, GERMANY, SEP 19-22, 2016
作者:  Cai, Miao[1];  Yang, Daoguo[1];  Zheng, Jianna[1];  Huang, Jianlin[2];  Liu, Dongjing[1]
收藏  |  浏览/下载:4/0  |  提交时间:2019/11/30


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