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Interface Engineering via MoS2 Insertion Layer for Improving Resistive Switching of Conductive-Bridging Random Access Memory 期刊论文
ADVANCED ELECTRONIC MATERIALS, 2019, 卷号: 5, 期号: 4
作者:  Wu, Facai;  Si, Shuyao;  Cao, Peng;  Wei, Wei;  Zhao, Xiaolong
收藏  |  浏览/下载:26/0  |  提交时间:2019/12/05
Interface Engineering via MoS2 Insertion Layer for Improving Resistive Switching of Conductive-Bridging Random Access Memory 期刊论文
Advanced Electronic Materials, 2019, 卷号: 5, 期号: 4
作者:  Wu, Facai;  Si, Shuyao;  Cao, Peng;  Wei, Wei;  Zhao, Xiaolong
收藏  |  浏览/下载:15/0  |  提交时间:2019/12/05
Origin of negative resistance in anion migration controlled resistive memory 期刊论文
Appl. Phys. Lett., 2018
作者:  Writam Banerjee;  Wu FC(伍法才);  Hu Y(胡媛);  Wu QT(吴全潭);  Wu ZH(吴祖恒)
收藏  |  浏览/下载:15/0  |  提交时间:2019/04/18
Negative differential resistance effect induced by metal ion implantation in SiO2 film for multilevel RRAM application 期刊论文
Nanotechnology, 2018
作者:  Wu FC(伍法才);  shuyao Si;  Shi T(时拓);  Zhao XL(赵晓龙);  Liu Q(刘琦)
收藏  |  浏览/下载:21/0  |  提交时间:2019/04/10
Flexible cation-based threshold selector for resistive switching memory integration 期刊论文
SCIENCE CHINA-INFORMATION SCIENCES, 2018, 卷号: 61, 期号: 6
作者:  Zhao, Xiaolong;  Wang, Rui;  Xiao, Xiangheng;  Lu, Congyan;  Wu, Facai
收藏  |  浏览/下载:15/0  |  提交时间:2019/12/05
Negative differential resistance effect induced by metal ion implantation in SiO2film for multilevel RRAM application 期刊论文
Nanotechnology, 2018, 卷号: 29, 期号: 5
作者:  Wu, Facai;  Si, Shuyao;  Shi, Tuo;  Zhao, Xiaolong;  Liu, Qi
收藏  |  浏览/下载:6/0  |  提交时间:2019/12/05
Negative differential resistance effect induced by metal ion implantation in SiO2film for multilevel RRAM application 期刊论文
Nanotechnology, 2018, 卷号: 29, 期号: 5
作者:  Si, Shuyao;  Wu, Facai;  Liu, Ming;  Long, Shibing;  Lv, Hangbing
收藏  |  浏览/下载:3/0  |  提交时间:2019/12/05
Negative differential resistance effect induced by metal ion implantation in SiO2 film for multilevel RRAM application 期刊论文
NANOTECHNOLOGY, 2018, 卷号: 29, 期号: 5
作者:  Wu, Facai;  Si, Shuyao;  Shi, Tuo;  Zhao, Xiaolong;  Liu, Qi
收藏  |  浏览/下载:4/0  |  提交时间:2019/12/05
Improvement of Device Reliability by Introducing a BEOL-Compatible TiN Barrier Layer in CBRAM 期刊论文
IEEE ELECTRON DEVICE LETTERS, 2017
作者:  Cao RR(曹荣荣);  Liu M(刘明);  Long SB(龙世兵);  Lv HB(吕杭炳);  Wang Y(王艳)
收藏  |  浏览/下载:21/0  |  提交时间:2018/07/12
基于六角氮化硼二维薄膜的忆阻器 期刊论文
ACTA PHYSICA SINICA, 2017
作者:  吴全潭;  时拓;  赵晓龙;  张续猛;  伍法才
收藏  |  浏览/下载:25/0  |  提交时间:2018/07/12


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