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Investigation of Step-Stress Accelerated Degradation Test Strategy for Ultraviolet Light Emitting Diodes 期刊论文
MATERIALS, 2019, 卷号: 12
作者:  Liang, Banglong;  Wang, Zili;  Qian, Cheng;  Ren, Yi;  Sun, Bo
收藏  |  浏览/下载：17/0  |  提交时间：2019/12/30
Analysis of the reliability of LED lamps during accelerated thermal aging test by online method 期刊论文
Optik, 2019, 卷号: 178, 页码: 1045-1050
作者:  J.Hao;  H.L.Ke;  R.T.Sun;  Q.Sun;  L.Jing
收藏  |  浏览/下载：1/0  |  提交时间：2020/08/24
The Influence of Junction Temperature Variation of LED on the Lifetime Estimation During Accelerated Aging Test 期刊论文
Ieee Access, 2019, 卷号: 7, 页码: 4773-4781
作者:  X.X.Wang;  L.Jing;  Y.Wang;  Q.Gao;  Q.Sun
收藏  |  浏览/下载：3/0  |  提交时间：2020/08/24
Mechanism Equivalence in Designing Optimum Step-Stress Accelerated Degradation Test Plan Under Wiener Process 期刊论文
IEEE ACCESS, 2018, 卷号: 6, 页码: 4440-4451
作者:  Wang, Han;  Zhao, Yu;  Ma, Xiaobing
收藏  |  浏览/下载：8/0  |  提交时间：2019/12/30
Step-down accelerated aging test for LED lamps based on nelson models 期刊论文
Optik, 2017, 卷号: 149
作者:  Hao, J.;  D. M. Li;  C. D. He;  Q. Sun and H. L. Ke
收藏  |  浏览/下载：15/0  |  提交时间：2018/06/13
Photometric and Colorimetric Assessment of LED Chip Scale Packages by Using a Step-Stress Accelerated Degradation Test (SSADT) Method 期刊论文
MATERIALS, 2017, 卷号: 10
作者:  Qian, Cheng;  Fan, Jiajie;  Fang, Jiayi;  Yu, Chaohua;  Ren, Yi
收藏  |  浏览/下载：8/0  |  提交时间：2019/12/30
Reliability Assessment of Solid State Lasers Based on Step Stress Accelerated Degradation Test 会议论文
PROCEEDINGS OF THE 2017 2ND JOINT INTERNATIONAL INFORMATION TECHNOLOGY, MECHANICAL AND ELECTRONIC ENGINEERING CONFERENCE (JIMEC 2017), 2017-01-01
作者:  Fu, Xiaolu;  Yang, Jun
收藏  |  浏览/下载：12/0  |  提交时间：2019/12/30
The Accelerated Degradation Test and Evaluation Methods for Printed Circuit Board Coatings 会议论文
Prognostics and System Health Management Conference (PHM- Hunan), Lab Sci & Technol Integrated Logist Support, Zhangjiajie, PEOPLES R CHINA, 2014-08-24
作者:  Zhu, Run;  Wang, Xiaohui;  Ren, Xiaoming
收藏  |  浏览/下载：3/0  |  提交时间：2020/01/06
The Accelerated Degradation Test and Evaluation Methods for Printed Circuit Board Coatings 会议论文
PROCEEDINGS OF 2014 PROGNOSTICS AND SYSTEM HEALTH MANAGEMENT CONFERENCE (PHM-2014 HUNAN), 2014-01-01
作者:  Zhu, Run;  Wang, Xiaohui;  Ren, Xiaoming
收藏  |  浏览/下载：6/0  |  提交时间：2020/01/06
Step-stress accelerated degradation test model of storage life based on lagged effect for electronic products 会议论文
19th International Conference on Industrial Engineering and Engineering Management: Engineering Management, Changsha, China, 2012-10-27
作者:  Yao, Jin-Yong;  Luo, Rui-Meng
收藏  |  浏览/下载：1/0  |  提交时间：2020/01/06

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