CORC

浏览/检索结果: 共34条,第1-10条 帮助

已选(0)清除 条数/页:   排序方式:
Resistive Switching Behavior in Ferroelectric Heterostructures 期刊论文
SMALL, 2019, 卷号: 15, 期号: 32, 页码: 13
作者:  Wang, Zhan Jie;  Bai, Yu
收藏  |  浏览/下载:24/0  |  提交时间:2021/02/02
Resistive Switching Behavior in Ferroelectric Heterostructures 期刊论文
SMALL, 2019, 卷号: 15, 期号: 32, 页码: 13
作者:  Wang, Zhan Jie;  Bai, Yu
收藏  |  浏览/下载:21/0  |  提交时间:2021/02/02
Power and Area Efficient FPGA Building Blocks Based on Ferroelectric FETs 期刊论文
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2019, 卷号: 66, 期号: 5, 页码: 1780-1793
作者:  Chen, Xiaoming;  Ni, Kai;  Niemier, Michael T.;  Han, Yinhe;  Datta, Suman
收藏  |  浏览/下载:61/0  |  提交时间:2019/08/16
Effects of total ionizing dose on single event effect sensitivity of FRAMs 期刊论文
MICROELECTRONICS RELIABILITY, 2019, 卷号: 95, 页码: 1-7
作者:  Ji, Qinggang;  Liu, Jie;  Li, Dongqing;  Liu, Tianqi;  Ye, Bing
收藏  |  浏览/下载:54/0  |  提交时间:2019/11/10
Single event effects in commercial FRAM and mitigation technique using neutron-induced displacement damage 期刊论文
Microelectronics Reliability, 2019, 卷号: 92, 页码: 149-154
作者:  Wei, Jia-nan;  Guo, Hong-xia;  Zhang, Feng-qi;  He, Chao-hui;  Ju, An-an
收藏  |  浏览/下载:28/0  |  提交时间:2019/11/19
Ferroelectric FETs-Based Nonvolatile Logic-in-Memory Circuits 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2019, 卷号: 27, 期号: 1, 页码: 159-172
作者:  Chen, Xiaoming;  Niemier, Michael;  Hu, Xiaobo Sharon;  Yin, Xunzhao
收藏  |  浏览/下载:70/0  |  提交时间:2019/04/03
Impact of chemical doping on resistive switching behavior in Zirconium-doped CHNHPbI based RRAM 期刊论文
Organic Electronics, 2019
作者:  Yuli He;  Guokun Ma;  Xiaowen Zhou;  Hengmei Cai;  Chunlei Liu
收藏  |  浏览/下载:5/0  |  提交时间:2019/12/17
Experimental study about single event functional interrupt of ferroelectric random access memory induced by 30-90 MeV proton 期刊论文
ACTA PHYSICA SINICA, 2018, 卷号: 67
作者:  Ju An-An;  Guo Hong-Xia;  Zhang Feng-Qi;  Guo Wei-Xin;  Ouyang Xiao-Ping
收藏  |  浏览/下载:16/0  |  提交时间:2019/11/19
Organic Ferroelectric-Based 1T1T Random Access Memory Cell Employing a Common Dielectric Layer Overcoming the Half-Selection Problem 期刊论文
ADVANCED MATERIALS, 2017, 卷号: 29, 期号: 34
作者:  Zhao, Qiang;  Wang, Hanlin;  Ni, Zhenjie;  Liu, Jie;  Zhen, Yonggang
收藏  |  浏览/下载:32/0  |  提交时间:2018/05/25


©版权所有 ©2017 CSpace - Powered by CSpace