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浏览/检索结果: 共4条，第1-4条 帮助 已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Primary investigation the impacts of the external memory (DDR3) failures on the performance of Xilinx Zynq-7010 SoC based system (MicroZed) using laser irradiation 期刊论文 Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 2017 作者:  Liu Shuhuan;  Du Xuecheng;  Du Xiaozhi;  Zhang Yao;  Mubashiru Lawal Olarewaju 收藏  |  浏览/下载：115/0  |  提交时间：2017/06/20 Continuous wave lasers  Digital storage  Failure modes  Irradiation  Laser beam effects  System-on-chip   Primary investigation the impacts of the external memory (DDR3) failures on the performance of Xilinx Zynq-7010 SoC based system (MicroZed) using laser irradiation 会议论文 作者:  Liu, Shuhuan;  Du, Xuecheng;  Du, Xiaozhi;  Zhang, Yao;  Mubashiru, Lawal Olarewaju 收藏  |  浏览/下载：11/0  |  提交时间：2019/11/26 Xilinx Zynq-7010 SoC  DDR3  Failure modes  Laser irradiation  MicroZed   Soft error evaluation and vulnerability analysis in Xilinx Zynq-7010 system-on chip 会议论文 作者:  Du, Xuecheng;  He, Chaohui;  Liu, Shuhuan;  Zhang, Yao;  Li, Yonghong 收藏  |  浏览/下载：10/0  |  提交时间：2019/12/02 Fault tree analysis  Reliability  System on Chip (SoC)  Soft error rate   Single Event Effects Testing of Xilinx Zynq-7010 SoC with Pu-239 Alpha Irradiation 会议论文 作者:  Du, Xuecheng;  Liu, Shuhuan;  He, Chaohui;  Du, Xin;  Li, Yonghong 收藏  |  浏览/下载：4/0  |  提交时间：2019/12/03 Single Event Functional Interrupt (SEFI)  Single Event Effects (SEE)  System on chip (SoC)