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CORC

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Analysis of AlGaN/GaN high electron mobility transistors failure mechanism under semi-on DC stress 期刊论文
journal of semiconductors, 2014
Yang, Zhen; Wang, Jinyan; Xu, Zhe; Li, Xiaoping; Zhang, Bo; Wang, Maojun; Yu, Min; Zhang, Jincheng; Ma, Xiaohua; Li, Yongbing
收藏  |  浏览/下载：7/0  |  提交时间：2015/11/10
GaN基蓝绿光LED电应力老化分析 期刊论文
2013
李志明; 潘书万; 陈松岩
收藏  |  浏览/下载：3/0  |  提交时间：2016/05/17
Analysis on the ageing mechanism of GaN-based blue and green LED by electrical stresses 期刊论文
http://dx.doi.org/10.3788/fgxb20133411.1521, 2013
Li, Zhi-Ming; Pan, Shu-Wan; Chen, Song-Yan; 陈松岩
收藏  |  浏览/下载：2/0  |  提交时间：2015/07/22
SILC-based reassignment of trapping and trap generation regimes of positive bias temperature instability 其他
2011-01-01
Yang, J.Q.; Masuduzzman, M.; Kang, J.F.; Alam, M.A.
收藏  |  浏览/下载：3/0  |  提交时间：2015/11/13
Including the Effects of Process-Related Variability on Radiation Response in Advanced Foundry Process Design Kits 期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2010, 卷号: 57, 期号: 6, 页码: 3570-3574
作者:  Li, Yanfeng;  Rezzak, Nadia;  Zhang, En Xia;  Schrimpf, Ronald D.;  Fleetwood, Daniel M.
收藏  |  浏览/下载：18/0  |  提交时间：2015/11/08
Impact of the displacement damage in channel and source/drain regions on the DC characteristics degradation in deep-submicron MOSFETs after heavy ion irradiation 期刊论文
chinese physics b, 2010
Xue Shou-Bin; Huang Ru; Huang De-Tao; Wang Si-Hao; Tan Fei; Wang Jian; An Xia; Zhang Xing
收藏  |  浏览/下载：3/0  |  提交时间：2015/11/13
Oxidative stress-induced leaky sarcoplasmic reticulum underlying acute heart failure in severe burn trauma 期刊论文
free radical biology and medicine, 2008
Deng, Jianxin; Wang, Gang; Huang, Qiaobing; Yan, Yuan; Ll, Kaltao; Tan, Wenchang; Jin, Chunhua; Wang, Yanru; Liu, Jie
收藏  |  浏览/下载：3/0  |  提交时间：2015/11/12
Defect Current and Defect Band Conduction of Ultrathin Oxides after Degradation and Breakdown 其他
2008-01-01
Xu, Mingzhen; Tan, Changhua
收藏  |  浏览/下载：3/0  |  提交时间：2015/11/13
Behavior of stress induced leakage current in thin HfO_xN_y films 期刊论文
Applied physics letters, 2008, 期号: 1, 页码: 012919.1-012919.3
作者:  Ran Jiang;  Zifeng Li
收藏  |  浏览/下载：11/0  |  提交时间：2019/12/26
Behavior of stress induced leakage current in thin HfOxNy films 期刊论文
APPLIED PHYSICS LETTERS, 2008, 卷号: 92, 期号: 1
作者:  Jiang, Ran;  Li, Zifeng
收藏  |  浏览/下载：3/0  |  提交时间：2019/12/26

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