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3D NAND存储器串列功能单元的可靠性研究 学位论文
: 中国科学院大学, 2019
作者:  邹兴奇
收藏  |  浏览/下载:21/0  |  提交时间:2019/09/06
Influence of rapid thermal annealing on the wafer warpage in 3D NAND flash memory 期刊论文
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2019, 卷号: Vol.34 No.2
作者:  Li, Qi;  Zhang, Yu;  Zou, Xingqi;  Gao, Jing;  Yang, Chuan
收藏  |  浏览/下载:19/0  |  提交时间:2019/12/13
Multiscale simulation of lateral charge loss in Si3N4 3D NAND flash based on density functional theory 期刊论文
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2019, 卷号: 52, 期号: 39
作者:  Wu, Jixuan;  Chen, Jiezhi;  Jiang, Xiangwei
收藏  |  浏览/下载:22/0  |  提交时间:2019/12/11
Program/Erase Cycling Enhanced Lateral Charge Diffusion in Triple-level Cell Charge-trapping 3D NAND Flash Memory 期刊论文
2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 2019, 卷号: 2019-March
作者:  Cao, Rui;  Wu, Jixuan;  Yang, Wenjing;  Chen, Jiezhi;  Jiang, Xiangwei
收藏  |  浏览/下载:12/0  |  提交时间:2019/12/11
Multiscale simulation of lateral charge loss in Si3N4 3D NAND flash based on density functional theory 期刊论文
Journal of Physics D: Applied Physics, 2019, 卷号: 52, 期号: 39
作者:  Wu, Jixuan;  Chen, Jiezhi;  Jiang, Xiangwei
收藏  |  浏览/下载:4/0  |  提交时间:2019/12/11
Atomistic Study of lateral Charge Diffusion Degradation During Program/Erase Cycling in 3-D NAND Flash memory 期刊论文
IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY, 2019, 卷号: 7, 期号: 1, 页码: 626-631
作者:  Wu, Jixuan;  Chen, Jiezhi;  Jiang, Xiangwei
收藏  |  浏览/下载:26/0  |  提交时间:2019/12/11
Influence of rapid thermal annealing on the wafer warpage in 3D NAND flash memory 期刊论文
Semiconductor Science and Technology, 2019, 卷号: Vol.34 No.2, 页码: 02LT01
作者:  Qi Li;  Yu Zhang;  Xingqi Zou;  Jing Gao;  Chuan Yang
收藏  |  浏览/下载:5/0  |  提交时间:2019/12/13
Multiscale simulation of lateral charge loss in Si 3 N 4 3D NAND flash based on density functional theory 期刊论文
Journal of Physics D: Applied Physics, 2019, 卷号: 52, 页码: 395103
作者:  Jixuan Wu ;   Jiezhi Chen ;   Xiangwei Jiang
收藏  |  浏览/下载:17/0  |  提交时间:2020/07/30
A fast read retry method for 3D NAND flash memories using novel valley search algorithm 期刊论文
IEICE Electronics Express, 2018
作者:  Huo ZL(霍宗亮);  Xu QK(徐启康);  Wang Q(王颀);  Li QH(李前辉)
收藏  |  浏览/下载:35/0  |  提交时间:2019/05/22
Word line interference based data recovery technique for 3D NAND Flash 期刊论文
IEICE Electronics Express, 2018
作者:  Huo ZL(霍宗亮);  Wang Q(王颀);  Cao HM(曹华敏);  Liu F(刘飞);  Yang L(杨柳)
收藏  |  浏览/下载:16/0  |  提交时间:2019/05/22


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