CORC

浏览/检索结果: 共14条,第1-10条 帮助

限定条件    
已选(0)清除 条数/页:   排序方式:
Insights into resistive switching characteristics of TaOx-RRAM by Monte-Carlo simulation 其他
2015-01-01
Zhao, Y.D.; Huang, P.; Chen, Z.; Liu, C.; Li, H.T.; Chen, B.; Ma, W.J.; Zhang, F.F.; Gao, B.; Liu, X.Y.; Kang, J.F.
收藏  |  浏览/下载:4/0  |  提交时间:2017/12/03
An Investigation of DC/AC hot carrier degradation in multiple-fin SOI FinFETs 其他
2015-01-01
Jiang, H.; Liu, X.Y.; Xu, N.; He, Y.D.; Du, G.; Zhang, X.
收藏  |  浏览/下载:3/0  |  提交时间:2017/12/03
3D RRAM: Design and optimization 其他
2014-01-01
Kang, Jinfeng; Gao, Bin; Chen, B.; Huang, P.; Zhang, F.F.; Deng, Y.X.; Liu, L.F.; Liu, X.Y.; Chen, H.-Y.; Jiang, Z.; Yu, S.M.; Wong, H.-S. Philip
收藏  |  浏览/下载:2/0  |  提交时间:2015/11/13
Scaling and operation characteristics of HfOx based vertical RRAM for 3D cross-point architecture 其他
2014-01-01
Kang, J.F.; Gao, B.; Chen, B.; Huang, P.; Zhang, F.F.; Liu, X.Y.; Chen, H.-Y.; Jiang, Z.; Wong, H.-S. Philip; Yu, Shimeng
收藏  |  浏览/下载:4/0  |  提交时间:2015/11/13
Multi-level resistive switching characteristics correlated with microscopic filament geometry in TMO-RRAM 其他
2013-01-01
Chen, B.; Kang, J.F.; Huang, P.; Deng, Y.X.; Gao, B.; Liu, R.; Zhang, F.F.; Liu, L.F.; Liu, X.Y.; Tran, X.A.; Yu, H.Y.
收藏  |  浏览/下载:4/0  |  提交时间:2015/11/13
Rectifying characteristics and implementation of n-Si/HfO2 based devices for 1D1R-based cross-bar memory array 其他
2012-01-01
Zhang, F.F.; Huang, P.; Chen, B.; Yu, D.; Fu, Y.H.; Ma, L.; Gao, B.; Liu, L.F.; Liu, X.Y.; Kang, J.F.
收藏  |  浏览/下载:4/0  |  提交时间:2015/11/13
Co-existed unipolar and bipolar resistive switching effect of HfO x-based RRAM 其他
2012-01-01
Chen, B.; Gao, B.; Fu, Y.H.; Liu, R.; Ma, L.; Huang, P.; Zhang, F.F.; Liu, L.F.; Liu, X.Y.; Kang, J.F.; Lian, G.J.
收藏  |  浏览/下载:2/0  |  提交时间:2015/11/13
Oxide-based RRAM: Physical based retention projection 其他
2010-01-01
Gao, B.; Kang, J.F.; Zhang, H.W.; Sun, B.; Chen, B.; Liu, L.F.; Liu, X.Y.; Han, R.Q.; Wang, Y.Y.; Yu, B.; Fang, Z.; Yu, H.Y.; Kwong, D.-L.
收藏  |  浏览/下载:2/0  |  提交时间:2015/11/13
Identification and application of current compliance failure phenomenon in RRAM device 其他
2010-01-01
Gao, B.; Chang, W.Y.; Sun, B.; Zhang, H.W.; Liu, L.F.; Liu, X.Y.; Han, R.Q.; Wu, T.B.; Kang, J.F.
收藏  |  浏览/下载:3/0  |  提交时间:2015/11/13
A compact model of resistive switching devices 其他
2010-01-01
Chen, B.; Jun, Q.Y.; Gao, B.; Zhang, F.F.; Wei, K.L.; Chen, Y.S.; Liu, L.F.; Liu, X.Y.; Kang, J.F.; Han, R.Q.
收藏  |  浏览/下载:2/0  |  提交时间:2015/11/13


©版权所有 ©2017 CSpace - Powered by CSpace