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First foundry platform of complementary tunnel-FETs in CMOS baseline technology for ultralow-power IoT applications: Manufacturability, variability and technology roadmap 其他
2016-01-01
Huang, Qianqian; Jia, Rundong; Chen, Cheng; Zhu, Hao; Guo, Lingyi; Wang, Junyao; Wang, Jiaxin; Wu, Chunlei; Wang, Runsheng; Bu, Weihai; Kang, Jing; Wang, Wenbo; Wu, Hanming; Lee, Shiuh-Wuu; Wang, Yangyuan; Huang, Ru
收藏  |  浏览/下载:6/0  |  提交时间:2017/12/03
Reliability variability simulation methodology for IC design: An EDA perspective 其他
2016-01-01
Zhang, Aixi; Huang, Chunyi; Guo, Tianlei; Chen, Alvin; Guo, Shaofeng; Wang, Runsheng; Huang, Ru; Xie, Jushan
收藏  |  浏览/下载:4/0  |  提交时间:2017/12/03
Deep Insights into Dielectric Breakdown in Tunnel FETs with Awareness of Reliability and Performance Co-Optimization 其他
2016-01-01
Huang, Qianqian; Jia, Rundong; Zhu, Jiadi; Lv, Zhu; Wang, Jiaxin; Chen, Cheng; Zhao, Yang; Wang, Runsheng; Bu, Weihai; Wang, Wenbo; Kang, Jin; Hua, Kelu; Wu, Hanming; Yu, Shaofeng; Wang, Yangyuan; Huang, Ru
收藏  |  浏览/下载:5/0  |  提交时间:2017/12/03
Comprehensive performance re-assessment of TFETs with a novel design by gate and source engineering from device/circuit perspective 其他
2015-01-01
Huang, Qianqian; Huang, Ru; Wu, Chunlei; Zhu, Hao; Chen, Cheng; Wang, Jiaxin; Guo, Lingyi; Wang, Runsheng; Ye, Le; Wang, Yangyuan
收藏  |  浏览/下载:4/0  |  提交时间:2017/12/03
First Foundry Platform of Complementary Tunnel-FETs in CMOS Baseline Technology for Ultralow-Power IoT Applications: Manufacturability, Variability and Technology Roadmap 其他
2015-01-01
Huang, Qianqian; Jia, Rundong; Chen, Cheng; Zhu, Hao; Guo, Lingyi; Wang, Junyao; Wang, Jiaxin; Wu, Chunlei; Wang, Runsheng; Bu, Weihai; Kang, Jing; Wang, Wenbo; Wu, Hanming; Lee, Shiuh-Wuu; Wang, Yangyuan; Huang, Ru
收藏  |  浏览/下载:3/0  |  提交时间:2017/12/03
Reliability variability simulation methodology for IC design: an EDA perspective 其他
2015-01-01
Zhang, Aixi; Huang, Chunyi; Guo, Tianlei; Chen, Alvin; Guo, Shaofeng; Wang, Runsheng; Huang, Ru; Xie, Jushan
收藏  |  浏览/下载:1/0  |  提交时间:2017/12/03
Simulation of correlated line-edge roughness in multi-gate devices 其他
2013-01-01
Jiang, Xiaobo; Wang, Runsheng; Huang, Ru; Chen, Jiang
收藏  |  浏览/下载:4/0  |  提交时间:2015/11/13
Investigations on the Correlation between Line-edge-roughness (LER) and Line-width-roughness (LWR) in Nanoscale CMOS Technology 其他
2012-01-01
Jiang, Xiaobo; Li, Meng; Wang, Runsheng; Chen, Jiang; Huang, Ru
收藏  |  浏览/下载:2/0  |  提交时间:2015/11/13
A new self-aligned BOI (Body-on-insulator) finfet fabricated on bulk SI wafers 其他
2008-01-01
Wang, Runsheng; Xu, Xiaoyan; Zhuge, Jing; Chen, Gang; Wang, Wenhua; Zhang, Xing; Wang, Yangyuan; Huang, Ru
收藏  |  浏览/下载:2/0  |  提交时间:2015/11/13


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