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Research on the properties of Ta2O5optical films prepared with APS plasma assisted deposition 会议论文
Shanghai, China, 2021-10-28
作者:  Pan, Yong-Gang;  Liu, Zheng;  Liu, Wen-Cheng;  Li, Mian;  Zhang, Si-Bao
收藏  |  浏览/下载：64/0  |  提交时间：2022/03/18
Research on the properties of HfO2optical films prepared with APS assisted electron beam evaporation deposition 会议论文
Hangzhou, China, 2021-05-23
作者:  Pan, Yong-Gang;  Liu, Zheng;  Li, Mian;  Liu, Wen-Cheng;  Bai, Long
收藏  |  浏览/下载：46/0  |  提交时间：2021/09/14
Deep Space Probing for Point Cloud Analysis 会议论文
线上, 2021-1
作者:  Yirong, Yang;  Bin Fan;  Yongcheng Liu;  Hua Lin;  Jiyong Zhang
收藏  |  浏览/下载：70/0  |  提交时间：2021/05/27
View-Angle Invariant Object Monitoring Without Image Registration 会议论文
online meeting, 2020-5-4
作者:  Zhang, Xin;  Huo, Chunlei;  Pan, Chunhong
收藏  |  浏览/下载：2/0  |  提交时间：2022/06/14
Study on Mnospectral Peak Identification of Hard Target 会议论文
hefei, 2019-9
作者:  LIU Jia Xiang;  LIU Jia Ju;  ZHU Zhi zheng;  FANG Yong Hua;  Dong Xiao
收藏  |  浏览/下载：8/0  |  提交时间：2021/12/13
An efficient eddy current correction method for fat quantification by bipolar readout sequence 会议论文
Paris Expo Porte de Versailles Paris, France, 2018
作者:  Zou Chao;  Cheng Chuanli;  Qiao Yangzi;  Peng Hao;  Tie Changjun
收藏  |  浏览/下载：35/0  |  提交时间：2019/01/31
Paired bioorthogonalglycometabolic labeling for enhancing T cell targeting and cytotoxicity against lymphoma cells 会议论文
上海, 2018
作者:  Wenjun Li;  Zhihong Sun;  Guanjun Deng;  Ping Gong;  Hong Pan
收藏  |  浏览/下载：48/0  |  提交时间：2019/01/31
Analysis of physical and chemical properties of XLPE insulation for long term running cable 会议论文
作者:  Zhang, Tao;  Nie, Shichao;  Pan, Zehua;  Li, Zhiwei;  Gao, Naikui
收藏  |  浏览/下载：8/0  |  提交时间：2019/11/19
Channel estimation in next generation LEO satellite communicastion systems 会议论文
3rd International Conference on Machine Learning and Intelligent Communications, MLICOM 2018, Hangzhou, China, 2018-07-06
作者:  Pan, Zheng;  Na, Zhenyu;  Liu, Xin;  Lu, Weidang
收藏  |  浏览/下载：4/0  |  提交时间：2019/12/02
A monocular-vision-based contouring error detection method for CNC machine tools 会议论文
2018 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2018, Houston, TX, United states, 2018-05-14
作者:  Li, Xiao;  Liu, Wei;  Pan, Yi;  Li, Hui;  Ma, Xin
收藏  |  浏览/下载：3/0  |  提交时间：2019/12/02

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