×
验证码:
换一张
忘记密码?
记住我
CORC
首页
科研机构
检索
知识图谱
申请加入
托管服务
登录
注册
在结果中检索
科研机构
华南理工大学 [5]
内容类型
会议论文 [5]
×
知识图谱
CORC
开始提交
已提交作品
待认领作品
已认领作品
未提交全文
收藏管理
QQ客服
官方微博
反馈留言
浏览/检索结果:
共5条,第1-5条
帮助
限定条件
内容类型:会议论文
专题:华南理工大学
第一署名单位
第一作者单位
通讯作者单位
已选(
0
)
清除
条数/页:
5
10
15
20
25
30
35
40
45
50
55
60
65
70
75
80
85
90
95
100
排序方式:
请选择
作者升序
作者降序
题名升序
题名降序
发表日期升序
发表日期降序
提交时间升序
提交时间降序
Dynamic growth of voids under effects of thermal and vapor pressure in electronic packaging (EI收录)
会议论文
13th International Conference on Fracture 2013, ICF 2013, Beijing, China, June 16, 2013 - June 21, 2013
作者:
Yao, Xiaohu[1]
;
Mei, Yue[1]
;
Fan, Xuejun[2]
收藏
  |  
浏览/下载:1/0
  |  
提交时间:2019/04/15
Elastic moduli
Electronics packaging
Hydrostatic pressure
Polymers
Vapor pressure
Vapors
Effects of design, structure and material on thermal-mechanical reliability of large array wafer level packages (EI收录)
会议论文
2009 International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP 2009, Beijing, China, August 10, 2009 - August 13, 2009
作者:
Varia, Bhavesh[1]
;
Fan, Xuejun[1,2]
;
Han, Qiang[2]
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2019/04/17
Computer crime
Copper
Copper smelting
Materials properties
Packaging
Polymer films
Polymers
Reconstruction (structural)
Reliability
Semiconducting silicon compounds
Silicon wafers
Spheres
Structural design
Technology
Thermomechanical treatment
Three dimensional
Effects of Design, Structure and Material on Thermal-Mechanical Reliability of Large Array Wafer Level Packages (CPCI-S收录)
会议论文
2009 INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY & HIGH DENSITY PACKAGING (ICEPT-HDP 2009)
作者:
Varia, Bhavesh[1]
;
Fan, Xuejun[1,2]
;
Han, Qiang[2]
收藏
  |  
浏览/下载:0/0
  |  
提交时间:2019/04/17
Shock performance study of solder joints in wafer level packages (EI收录)
会议论文
2009 International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP 2009, Beijing, China, August 10, 2009 - August 13, 2009
作者:
Ranouta, Amarinder Singh[1]
;
Fan, Xuejun[1,2]
;
Han, Qiang[2]
收藏
  |  
浏览/下载:1/0
  |  
提交时间:2019/04/17
Electronics packaging
Finite element method
Fluorine containing polymers
Packaging
Quality assurance
Reliability analysis
Safety factor
Semiconducting intermetallics
Shock testing
Soldering alloys
Shock Performance Study of Solder Joints in Wafer Level Packages (CPCI-S收录)
会议论文
2009 INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY & HIGH DENSITY PACKAGING (ICEPT-HDP 2009)
作者:
Ranouta, Amarinder Singh[1]
;
Fan, Xuejun[1,2]
;
Han, Qiang[2]
收藏
  |  
浏览/下载:0/0
  |  
提交时间:2019/04/17
©版权所有 ©2017 CSpace - Powered by
CSpace