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An investigation of FinFET single-event latch-up characteristic and mitigation method 期刊论文
MICROELECTRONICS RELIABILITY, 2020, 卷号: 114, 页码: 8
作者:  Li, Dongqing;  Liu, Tianqi;  Wu, Zhenyu;  Cai, Chang;  Zhao, Peixiong
收藏  |  浏览/下载:13/0  |  提交时间:2021/12/13
TCAD  FinFET  SCR  SEL  
Heat-killedSalmonellaTyphimurium protects mice against carbon ion radiation 期刊论文
JOURNAL OF INTERNATIONAL MEDICAL RESEARCH, 2020, 卷号: 48, 期号: 10, 页码: 12
作者:  Liao, Zebin;  Liu, Zhe;  Gong, Zhenyu;  Hu, Xuguang;  Chen, Yuanyuan
收藏  |  浏览/下载:22/0  |  提交时间:2021/12/15


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