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The Optimization of Gate All Around-L-Shaped Bottom Select Transistor in 3D NAND Flash Memory 期刊论文
Journal of Nanoscience and Nanotechnology, 2018
作者:  Huo ZL(霍宗亮);  Xia ZL(夏志良);  Chen GX(陈国星);  Zhang Y(张瑜);  Jiang DD(姜丹丹)
收藏  |  浏览/下载:30/0  |  提交时间:2019/05/22
A Novel Program Scheme for Program Disturbance Optimization in 3-D NAND Flash Memory 期刊论文
IEEE Electron Device Letters, 2018
作者:  Huo ZL(霍宗亮);  An Zhang;  Hongtao Liu;  Zou XQ(邹兴奇);  Jin L(靳磊)
收藏  |  浏览/下载:13/0  |  提交时间:2019/05/22
Investigation of Cycling-Induced Dummy Cell Disturbance in 3D NAND Flash Memory 期刊论文
IEEE ELECTRON DEVICE LETTERS, 2018
作者:  Huo ZL(霍宗亮);  Chen GX(陈国星);  Zhang Y(张瑜);  Jiang DD(姜丹丹);  Jin L(靳磊)
收藏  |  浏览/下载:14/0  |  提交时间:2019/05/22


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