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浏览/检索结果: 共5条，第1-5条 帮助 限定条件 发表日期：2017    专题：北京大学    第一署名单位    第一作者单位    通讯作者单位     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Insights Into the Power-Off and Power-On Transient Performance of Power-Rail ESD Clamp Circuits 期刊论文 IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2017 Lu, Guangyi; Wang, Yuan; Wang, Yize; Zhang, Xing 收藏  |  浏览/下载：5/0  |  提交时间：2017/12/03 Electrostatic discharge (ESD)  ESD clamp circuit  transient response  soft failure  DESIGN   Low-Leakage ESD Power Clamp Design With Adjustable Triggering Voltage for Nanoscale Applications 期刊论文 IEEE TRANSACTIONS ON ELECTRON DEVICES, 2017 Lu, Guangyi; Wang, Yuan; Wang, Yize; Zhang, Xing 收藏  |  浏览/下载：7/0  |  提交时间：2017/12/03 Electrostatic discharge (ESD)  ESD power clamp  false-triggering immunity  leakage current  triggering voltage  TECHNOLOGY  PROTECTION  CIRCUITS   A novel TLP-based method to deliver IEC 61000-4-2 ESD stress 期刊论文 IEICE ELECTRONICS EXPRESS, 2017 Wang, Yize; Wang, Yuan; Lu, Guangyi; Cao, Jian; Zhang, Xing 收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03 electrostatic discharge (ESD)  transmission line pulse (TLP) test  SPICE model   Power-Rail ESD Clamp Circuit with Parasitic-BJT and Channel Parallel Shunt Paths to Achieve Enhanced Robustness 期刊论文 IEICE TRANSACTIONS ON ELECTRONICS, 2017 Wang, Yuan; Lu, Guangyi; Wang, Yize; Zhang, Xing 收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03 electrostatic discharge (ESD)  robustness  false-triggering immunity  transmission-line-pulsing (TLP) test  NANOSCALE CMOS TECHNOLOGY  PROTECTION  DESIGN  NMOS   Insight into multiple-triggering effect in DTSCRs for ESD protection 期刊论文 半导体学报（英文版）, 2017 Lizhong Zhang; Yuan Wang; Yize Wang; Yandong He 收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03 electrostatic discharge (ESD) diode-triggered silicon-controlled rectifier (DTSCR) double snapback transmission line pulse (TLP) test  electrostatic discharge (ESD)  diode-triggered silicon-controlled rectifier (DTSCR)  double snapback  transmission line pulse (TLP) test