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Insights Into the Power-Off and Power-On Transient Performance of Power-Rail ESD Clamp Circuits
Lu, Guangyi ; Wang, Yuan ; Wang, Yize ; Zhang, Xing
刊名IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
2017
关键词Electrostatic discharge (ESD) ESD clamp circuit transient response soft failure DESIGN
DOI10.1109/TDMR.2017.2737653
英文摘要The power-off and power-on transient performance of power-rail electrostatic discharge (ESD) clamp circuits is investigated in this paper. In order to serve this purpose, the transient performance of a timed shutoff power-rail ESD clamp circuit in a 65-nm CMOS process is characterized by a three-terminal test method. Based on the characterization results, several insights are summarized: it is found that the big-FET response time of the investigated circuit is dependent on the pulse peak voltage. Besides, the resistor-capacitor network is verified to be a slew-rate detector instead of a rise-time detector. Moreover, the different bigFET response mechanisms under various poweron disturbances are clarified. In addition, the validity of these insights for other designs is also discussed in this paper.; Natural Science Foundation of Beijing, China [4162030]; SCI(E); ARTICLE; 3; 577-584; 17
语种英语
内容类型期刊论文
源URL[http://ir.pku.edu.cn/handle/20.500.11897/471113]  
专题信息科学技术学院
推荐引用方式
GB/T 7714
Lu, Guangyi,Wang, Yuan,Wang, Yize,et al. Insights Into the Power-Off and Power-On Transient Performance of Power-Rail ESD Clamp Circuits[J]. IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY,2017.
APA Lu, Guangyi,Wang, Yuan,Wang, Yize,&Zhang, Xing.(2017).Insights Into the Power-Off and Power-On Transient Performance of Power-Rail ESD Clamp Circuits.IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY.
MLA Lu, Guangyi,et al."Insights Into the Power-Off and Power-On Transient Performance of Power-Rail ESD Clamp Circuits".IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY (2017).
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