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An SEU resilient, SET filterable and cost effective latch in presence of PVT variations 期刊论文
Microelectronics Reliability, 2016, 卷号: Vol.63, 页码: 239-250
作者:  Liang,Huaguo;  Li,Xuejun;  Jiang,Cuiyun;  Yan,Aibin;  Ouyang,Yiming
收藏  |  浏览/下载:2/0  |  提交时间:2019/04/22
Novel Low Cost and Double Node Upset Tolerant Latch Design for Nanoscale CMOS Technology 期刊论文
Proceedings of the Asian Test Symposium, 2016, 页码: 252-256
作者:  Liang,Huaguo;  Xu,Xiaolin;  Fang,Xiangsheng;  Yan,Aibin;  Huang,Zhengfeng
收藏  |  浏览/下载:9/0  |  提交时间:2019/04/22
A Methodology for Characterization of SET Propagation in SRAM-Based FPGAs. 期刊论文
IEEE Transactions on Nuclear Science, 2016, 卷号: Vol.63 No.6, 页码: 2985-2992
作者:  Liang,Huaguo;  Ni,Tianming;  Xu,Xiumin;  Yi,Maoxiang;  Lu,Yingchun
收藏  |  浏览/下载:14/0  |  提交时间:2019/04/22


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