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	A Methodology for Characterization of SET Propagation in SRAM-Based FPGAs.
	Liang,Huaguo; Ni,Tianming; Xu,Xiumin; Yi,Maoxiang; Lu,Yingchun; Yan,Aibin; Jiang,Cuiyun; Ouyang,Yiming; Huang,Zhengfeng
刊名	IEEE Transactions on Nuclear Science
	2016
卷号	Vol.63 No.6页码:2985-2992
关键词	FLASH-BASED FPGAS MITIGATION INJECTION
ISSN号	0018-9499
URL标识	查看原文
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/2155947
专题	安徽大学
作者单位	1.Anhui Univ, Sch Comp Sci & Technol, Hefei 230000, Peoples R China 2.Hefei Univ Technol, Sch Elect Sci & Appl Phys, Hefei 230000, Peoples R China 3.Hefei Univ Technol, Sch Math, Hefei 230000, Peoples R China 4.Hefei Univ Technol, Sch Comp & Informat, Hefei 230000, Peoples R China
推荐引用方式 GB/T 7714	Liang,Huaguo,Ni,Tianming,Xu,Xiumin,et al. A Methodology for Characterization of SET Propagation in SRAM-Based FPGAs.[J]. IEEE Transactions on Nuclear Science,2016,Vol.63 No.6:2985-2992.
APA	Liang,Huaguo.,Ni,Tianming.,Xu,Xiumin.,Yi,Maoxiang.,Lu,Yingchun.,...&Huang,Zhengfeng.(2016).A Methodology for Characterization of SET Propagation in SRAM-Based FPGAs..IEEE Transactions on Nuclear Science,Vol.63 No.6,2985-2992.
MLA	Liang,Huaguo,et al."A Methodology for Characterization of SET Propagation in SRAM-Based FPGAs.".IEEE Transactions on Nuclear Science Vol.63 No.6(2016):2985-2992.

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