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Studying the high-field electron conduction of tetrahedral amorphous carbon thin films by conducting atomic force microscopy 期刊论文
MATERIALS CHARACTERIZATION, 2002, 卷号: 48, 期号: 2-3, 页码: 205-210
Luo, EZ; Lin, S; Xie, Z; Xu, JB; Wilson, IH; Yu, YH; Yu, LJ; Wang, X
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