Studying the high-field electron conduction of tetrahedral amorphous carbon thin films by conducting atomic force microscopy

	Studying the high-field electron conduction of tetrahedral amorphous carbon thin films by conducting atomic force microscopy
	Luo, EZ ; Lin, S ; Xie, Z ; Xu, JB ; Wilson, IH ; Yu, YH ; Yu, LJ ; Wang, X
刊名	MATERIALS CHARACTERIZATION
	2002
卷号	48 期号:2-3 页码:205-210
关键词	EMISSION MECHANISMS DIAMOND
ISSN号	1044-5803
通讯作者	Luo, EZ, Chinese Univ Hong Kong, Dept Elect Engn, Hong Kong, Hong Kong, Peoples R China
学科主题	Materials Science, Characterization & Testing
收录类别	SCI
语种	英语
公开日期	2012-03-24
内容类型	期刊论文
源URL	[http://ir.sim.ac.cn/handle/331004/95634]
专题	上海微系统与信息技术研究所_功能材料与器件_期刊论文
推荐引用方式 GB/T 7714	Luo, EZ,Lin, S,Xie, Z,et al. Studying the high-field electron conduction of tetrahedral amorphous carbon thin films by conducting atomic force microscopy[J]. MATERIALS CHARACTERIZATION,2002,48(2-3):205-210.
APA	Luo, EZ.,Lin, S.,Xie, Z.,Xu, JB.,Wilson, IH.,...&Wang, X.(2002).Studying the high-field electron conduction of tetrahedral amorphous carbon thin films by conducting atomic force microscopy.MATERIALS CHARACTERIZATION,48(2-3),205-210.
MLA	Luo, EZ,et al."Studying the high-field electron conduction of tetrahedral amorphous carbon thin films by conducting atomic force microscopy".MATERIALS CHARACTERIZATION 48.2-3(2002):205-210.