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浏览/检索结果: 共4条，第1-4条 帮助 限定条件 专题：半导体研究所    第一署名单位    第一作者单位    通讯作者单位     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 High responsivity ultraviolet photodetector based on crack-free GaN on Si (111) 会议论文 33rd international symposium on compound semiconductors, vancouver, canada, aug 13-17, 2006 Wang, XY (Wang, Xiaoyan); Wang, XL (Wang, Xiaoliang); Wang, BZ (Wang, Baozhu); Xiao, HL (Xiao, Hongling); Liu, HX (Liu, Hongxin); Wang, JX (Wang, Junxi); Zeng, YP (Zeng, Yiping); Li, JM (Li, Jinmin) 收藏  |  浏览/下载：125/38  |  提交时间：2010/03/29 BUFFER LAYER  STRESS  PHOTODIODES  REDUCTION  DETECTORS  SAPPHIRE  EPITAXY  GROWTH   Photoluminescence of doped zns nanoparticles under hydrostatic pressure 期刊论文 Physica status solidi b-basic research, 2004, 卷号: 241, 期号: 14, 页码: 3248-3256 作者:  Li, GH;  Su, FH;  Ma, BS;  Ding, K;  Xu, SJ 收藏  |  浏览/下载：26/0  |  提交时间：2019/05/12 Pressure behavior of Te isoelectronic centers in S-rich ZnS1-xTex alloy 会议论文 10th international conference on high pressures in semiconductor physics (hpsp-x), guildford, england, aug 05-08, 2002 Li GH; Fang ZL; Su FH; Ma BS; Ding K; Han HX; Sou IK; Ge WK 收藏  |  浏览/下载：11/0  |  提交时间：2010/11/15 OPTICAL-ABSORPTION  ZNS-TE  TRANSITION  EDGE   Electrical properties of GaN deposited on nitridated sapphire by molecular beam epitaxy using NH3 cracked on the growing surface 会议论文 10th international conference on molecular beam epitaxy (mbe-x), cannes, france, aug 31-sep 04, 1998 Zhang JP; Sun DZ; Li XB; Wang XL; Kong MY; Zeng YP; Li JM; Lin LY 收藏  |  浏览/下载：7/0  |  提交时间：2010/11/15 STRESS  GROWTH