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A comparison of the modified likelihood-ratio-test-based shewhart and EWMA control charts for monitoring binary profiles 会议论文
19th International Conference on Industrial Engineering and Engineering Management: Assistive Technology of Industrial Engineering, Changsha, China, 2012-10-27
作者:  Yin, Chao;  He, Yihai;  Shen, Zhen;  Wu, Chun-Hui
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