| A comparison of the modified likelihood-ratio-test-based shewhart and EWMA control charts for monitoring binary profiles | |
| Yin, Chao; He, Yihai; Shen, Zhen; Wu, Chun-Hui | |
| 2013 | |
| 会议名称 | 19th International Conference on Industrial Engineering and Engineering Management: Assistive Technology of Industrial Engineering |
| 会议日期 | 2012-10-27 |
| 会议地点 | Changsha, China |
| 页码 | 23-29 |
| 收录类别 | EI |
| URL标识 | 查看原文 |
| 内容类型 | 会议论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/6571902 |
| 专题 | 北京航空航天大学 |
| 推荐引用方式 GB/T 7714 | Yin, Chao,He, Yihai,Shen, Zhen,et al. A comparison of the modified likelihood-ratio-test-based shewhart and EWMA control charts for monitoring binary profiles[C]. 见:19th International Conference on Industrial Engineering and Engineering Management: Assistive Technology of Industrial Engineering. Changsha, China. 2012-10-27. |
| 个性服务 |
| 查看访问统计 |
| 相关权益政策 |
| 暂无数据 |
| 收藏/分享 |
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。
修改评论