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科研机构
北京大学 [19]
内容类型
期刊论文 [12]
其他 [7]
发表日期
2017 [1]
2016 [4]
2015 [1]
2013 [1]
2011 [1]
2010 [7]
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专题:北京大学
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New Understanding of Random Telegraph Noise Amplitude in Tunnel FETs
期刊论文
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2017
Chen, Cheng
;
Huang, Qianqian
;
Zhu, Jiadi
;
Zhao, Yang
;
Guo, Lingyi
;
Huang, Ru
收藏
  |  
浏览/下载:9/0
  |  
提交时间:2017/12/03
Amplitude
annealing process
band-to-band tunneling (BTBT) generation rate
nonuniformity
random dopant fluctuation (RDF)
random telegraph noise (RTN)
source doping concentration
tunnel FET (TFET)
FIELD-EFFECT TRANSISTORS
RANDOM DOPANT FLUCTUATION
LINE-EDGE ROUGHNESS
1/F NOISE
ELECTRICAL NOISE
CMOS DEVICES
VARIABILITY
IMPACT
TFET
Predictive compact modeling of random variations in FinFET technology for 16/14nm node and beyond
其他
2016-01-01
Jiang, Xiaobo
;
Wang, Xingsheng
;
Wang, Runsheng
;
Cheng, Binjie
;
Asenov, Asen
;
Huang, Ru
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2017/12/03
A Simple Method to Decompose the Amplitudes of Different Random Variation Sources in FinFET Technology
其他
2016-01-01
Jiang, Xiaobo
;
Wang, Runsheng
;
Huang, Ru
;
Wang, Xingsheng
;
Cheng, Binjie
;
Asenov, Asen
收藏
  |  
浏览/下载:1/0
  |  
提交时间:2017/12/03
LINE-EDGE ROUGHNESS
VARIABILITY
LWR
LER
A Device-Level Characterization Approach to Quantify the Impacts of Different Random Variation Sources in FinFET Technology
期刊论文
IEEE ELECTRON DEVICE LETTERS, 2016
Jiang, Xiaobo
;
Guo, Shaofeng
;
Wang, Runsheng
;
Wang, Xingsheng
;
Cheng, Binjie
;
Asenov, Asen
;
Huang, Ru
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2017/12/04
FinFET
random variation
characterization
line-edge roughness (LER)
metal gate granularity (MGG)
LINE-EDGE ROUGHNESS
VARIABILITY
LWR
LER
Characteristics of atomic layer deposited transparent aluminum-doped zinc oxide thin films at low temperature
期刊论文
RARE METALS, 2016
Zhao, Fei-Long
;
Dong, Jun-Chen
;
Zhao, Nan-Nan
;
Wu, Jing
;
Han, De-Dong
;
Kang, Jin-Feng
;
Wang, Yi
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2017/12/04
Atomic layer deposition
Aluminum-doped ZnO thin film
Transparent
Uniformity
TRANSISTORS
SEMICONDUCTORS
Predictive Compact Modeling of Random Variations in FinFET Technology for 16/14nm Node and Beyond
其他
2015-01-01
Jiang, Xiaobo
;
Wang, Xingsheng
;
Wang, Runsheng
;
Cheng, Binjie
;
Asenov, Asen
;
Huang, Ru
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2017/12/03
Back-Gate Bias Dependence of the Statistical Variability of FDSOI MOSFETs With Thin BOX
期刊论文
ieee电子器件汇刊, 2013
Yang, Yunxiang
;
Markov, Stanislav
;
Cheng, Binjie
;
Zain, Anis Suhaila Mohd
;
Liu, Xiaoyan
;
Asenov, Asen
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2015/11/13
Back-gate bias
line edge roughness (LER)
metal gate granularity (MGG)
random dopant fluctuation (RDF)
statistical variability (SV)
thin buried oxide (BOX)
INTRINSIC PARAMETER FLUCTUATIONS
SIMULATION
DECANANOMETER
IMPACT
Investigation on Variability in Metal-Gate Si Nanowire MOSFETs: Analysis of Variation Sources and Experimental Characterization
期刊论文
ieee电子器件汇刊, 2011
Wang, Runsheng
;
Jing Zhuge
;
Huang, Ru
;
Yu, Tao
;
Zou, Jibin
;
Kim, Dong-Won
;
Park, Donggun
;
Wang, Yangyuan
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2015/11/10
Line-edge roughness (LER)
metal-gate work function variation (WFV)
modeling
random dopant fluctuation (RDF)
Si nanowire metal-oxide-semiconductor field-effect transistor (MOSFET) (SNWT)
variability
INTRINSIC PARAMETER FLUCTUATIONS
THRESHOLD VOLTAGE FLUCTUATION
CARRIER TRANSPORT
PERFORMANCE
IMPACT
TRANSISTORS
CMOS
DECANANOMETER
INTEGRATION
MOBILITY
Molecular simulations of electroosmotic flows in rough nanochannels
期刊论文
计算物理学杂志, 2010
Liu, Jin
;
Wang, Moran
;
Chen, Shiyi
;
Robbins, Mark O.
收藏
  |  
浏览/下载:2/0
  |  
提交时间:2015/11/12
Electrokinetic transport
PPPM method
Multi-grid method
Molecular dynamics
Electroosmotic flows
EWALD SUMMATION TECHNIQUES
ELECTROKINETIC TRANSPORT
LIQUID FLOW
BOLTZMANN SIMULATIONS
DYNAMICS SIMULATION
BOUNDARY-CONDITIONS
COULOMBIC SYSTEMS
MESH METHOD
MICROCHANNELS
CONTINUUM
Research on microwave two-scale scattering model for conducting random rough surface
期刊论文
zhongguo kuangye daxue xuebaojournal of china university of mining and technology, 2010
Yu, Fan
;
Zhao, Ying-Shi
;
Shen, Xin-Yi
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2015/11/17
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