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Investigation of the impact of grain boundary on threshold voltage of 3-D MLC NAND flash memory 其他
2015-01-01
Lun, Zhiyuan; Shen, Lei; Cong, Yingying; Du, Gang; Liu, Xiaoyan; Wang, Yi
收藏  |  浏览/下载：6/0  |  提交时间：2017/12/03
An efficient test structure for interface trap characterization under BTI stresses 其他
2014-01-01
He, Yandong; Zhang, Ganggang; Han, Lin; Zhang, Xing
收藏  |  浏览/下载：3/0  |  提交时间：2015/11/13
Random Interface Trap Induced Fluctuation in 22nm High-k/Metal Gate Junctionless and Inversion-mode FinFETs 其他
2013-01-01
Wang, Yijiao; Wei, Kangliang; Liu, Xiaoyan; Du, Gang; Kang, Jinfeng
收藏  |  浏览/下载：2/0  |  提交时间：2015/11/13
A Test Structure and Spectroscopic Method for Monitoring Interface Traps 其他
2013-01-01
Wei, Chao; He, Yandong; Du, Gang; Zhang, Ganggang; Zhang, Xing
收藏  |  浏览/下载：1/0  |  提交时间：2015/11/13
Method for direct characterizing interface traps in STI-type high voltage SOI LDMOSFETs 其他
2011-01-01
He, Yandong; Zhang, Ganggang
收藏  |  浏览/下载：2/0  |  提交时间：2015/11/13
An accurate method to extract and separate interface and gate oxide traps by the MOSFET subthreshold current 其他
2011-01-01
Zhang, Chenfei; Ma, Chenyue; Xu, Jiaojiao; Wang, Ruonan; Zhao, Xiaojin; Gu, Xin; Zhang, Xiufang; Wu, Wen; Wang, Wenping; Zhao, Wei; Ma, Yong; Wang, Ruonan; Zhang, Dongwei; Bian, Wei; Yang, Guozeng; Yan, Zhang; Liu, Zhiwei; Ma, Yong; He, Jin
收藏  |  浏览/下载：5/0  |  提交时间：2015/11/13
Hysteresis-Free Carbon Nanotube Field Effect Transistors Without Any Post-Treatment 其他
2009-01-01
Wang, Chuan; Fu, Yunyi; Guo, Ao; Liu, Jia; Guan, Lunhui; Shi, Zujin; Gu, Zhennan; Huang, Ru; Zhang, Xing
收藏  |  浏览/下载：2/0  |  提交时间：2015/11/16
Drain bias effect on the interface traps of pMOSFETs under negative bias temperature stress 其他
2009-01-01
Pan, J.Y.; Yang, J.Q.; Qiao, Y.; Liu, X.Y.; Han, R.Q.; Kang, J.F.; Liao, C.C.; Wu, H.M.; Wu, Y.J.
收藏  |  浏览/下载：4/0  |  提交时间：2015/11/13
Recovery Characteristics of NBTI of pMOSFETs with Oxynitride Dielectrics Under Drain Bias 其他
2008-01-01
Yang, Jiaqi; Pan, Junyan; Huang, Lihua; Liu, Xiaoyan; Han, Ruqi; Kang, Jinfeng; Zhang, L. F.; Zhu, Z. W.; Liao, C. C.; Wu, H. M.
收藏  |  浏览/下载：1/0  |  提交时间：2015/11/10
FinFET Reliability Study by Forward Gated-Diode Method 其他
2008-01-01
Ma, Chenyue; Li, Bo; Wei, Yiqun; Zhang, Lining; He, Jin; Zhang, Xing; Lin, Xinnan
收藏  |  浏览/下载：4/0  |  提交时间：2015/11/13

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