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New Framework for the random charging/discharging of oxide traps in HfO2 gate dielectric: Ab-initio simulation and experimental evidence 其他
2015-01-01
Ji, Jingwei; Qiu, Yingxin; Guo, Shaofeng; Wang, Runsheng; Ren, Pengpeng; Hao, Peng; Huang, Ru
收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03
High performance aluminum-doped ZnO thin film transistors with high-K gate dielectrics fabricated at low temperature 其他
2013-01-01
Han, Dedong; Cai, Jian; Wang, Wei; Wang, Liangliang; Wang, Yi; Liu, Lifeng; Zhang, Shengdong
收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03
Bias temperature instability of binary oxide based reram 其他
2010-01-01
Fang, Z.; Yu, H.Y.; Liu, W.J.; Pey, K.L.; Li, X.; Wu, L.; Wang, Z.R.; Lo, Patrick G.Q.; Gao, B.; Kang, J.F.
收藏  |  浏览/下载：3/0  |  提交时间：2015/11/13
Characteristics of sub-100nm Ferroelectric Field Effect Transistor with High-k Buffer Layer 其他
2008-01-01
Jin, Rui; Song, Yuncheng; Ji, Min; Xu, Honghua; Kang, Jinfeng; Han, Ruqi; Liu, Xiaoyan
收藏  |  浏览/下载：5/0  |  提交时间：2015/11/10
Coulomb Scattering induced mobility degradation in Ultrathin-body SOI MOSFETs with high-k gate stack 其他
2007-01-01
Yang, J.F.; Xia, Z.L.; Du, G.; Liu, X.Y.; Han, R.Q.; Kang, J.F.
收藏  |  浏览/下载：3/0  |  提交时间：2015/11/10
A comparative study of program/erase characteristic of low-voltage low-power NROM using high-K materials as tunnel dielectric 其他
2005-01-01
Cai, Y. M.; Huang, R.; Shan, X. N.; Long, Z. F.; Li, Y.; Wang, Y. Y.
收藏  |  浏览/下载：2/0  |  提交时间：2015/11/13
Effect of post-annealing on the physical and electrical properties of LaAlO3 gate dielectrics 其他
2004-01-01
Lu, XB; Zhang, X; Huang, R; Lu, HB; Chen, ZH; Zhou, HW; Wang, XP; Nguyen, BY; Wang, CZ
收藏  |  浏览/下载：3/0  |  提交时间：2015/11/13
Selected topics on HfO2 gate dielectrics for future ULSI CMOS devices 其他
2004-01-01
Li, M.F.; Yu, H.Y.; Hou, Y.T.; Kang, J.F.; Wang, X.P.; Shen, C.; Ren, C.; Yeo, Y.C.; Zhu, C.X.; Chan, D.S.H.; Chin, Albert; Kwong, D.L.
收藏  |  浏览/下载：3/0  |  提交时间：2015/11/13
Reliability characteristics of high-K gate dielectrics HfO2 in metal-oxide semiconductor capacitors 其他
2003-01-01
Han, DD; Kang, JF; Lin, CH; Han, RQ
收藏  |  浏览/下载：3/0  |  提交时间：2015/11/10
A novel idea: Using DTMOS to suppress FIBL effect in MOSFET with high-k gate dielectrics 其他
2003-01-01
Wang, Wenping; Huang, Ru; Yang, Shengqi; Zhang, Guoyan; Zhang, Xing; Wang, Yangyuan
收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03

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