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浏览/检索结果: 共5条，第1-5条 帮助 限定条件 内容类型：其他     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 New concept of planar germanium MOSFET with stacked germanide layers at source/drain 其他 2015-01-01 Xu, Hao; Sun, Lei; Zhang, Yi-Bo; Han, Jing-Wen; Wang, Yi; Zhang, Sheng-Dong 收藏  |  浏览/下载：5/0  |  提交时间：2017/12/04 HIGH-KAPPA GATE  SCHOTTKY SOURCE/DRAIN  METAL GATE  MOBILITY  CONTACTS  SI  TECHNOLOGY  TRANSISTOR  SUBSTRATE  PMOSFETS   Characterization of Random Telegraph Noise in Scaled High-kappa/Metal-gate MOSFETs with SiO2/HfO2 Gate Dielectrics 其他 2013-01-01 Li, Meng; Wang, Runsheng; Zou, Jibin; Huang, Ru 收藏  |  浏览/下载：6/0  |  提交时间：2015/11/13 New Observations on Complex RTN in Scaled High-kappa/Metal-gate MOSFETs - the Role of Defect Coupling under DC/AC Condition 其他 2013-01-01 Ren, Pengpeng; Hao, Peng; Liu, Changze; Wang, Runsheng; Jiang, Xiaobo; Qin, Yingxin; Huang, Ru; Guo, Shaofeng; Luo, Mulong; Zou, Jibin; Li, Meng; Wang, Jianping; Wu, Jingang; Liu, Jinhua; Bu, Weihai; Wong, Waisum; Yu, Scott; Wu, Hanming; Lee, Shiuh-Wuu; Wang, Yangyuan 收藏  |  浏览/下载：3/0  |  提交时间：2015/11/13 Experimental Study on the Variation of NBTI Degradation in Nano-scaled High-kappa/Metal-gate PFETs 其他 2012-01-01 Liu, Changze; Ren, Pengpeng; Wang, Runsheng; Huang, Ru; Wang, Jianping; Wu, Jingang; Wang, Yangyuan 收藏  |  浏览/下载：3/0  |  提交时间：2015/11/13 New Observations on AC NBTI induced Dynamic Variability in Scaled High-kappa/Metal-gate MOSFETs: Characterization, Origin of Frequency Dependence, and Impacts on Circuits 其他 2012-01-01 Liu, Changze; Ren, Pengpeng; Wang, Runsheng; Huang, Ru; Ou, Jiaojiao; Huang, Qianqian; Zou, Jibin; Wang, Jianping; Wu, Jingang; Yu, Shaofeng; Wu, Hanming; Lee, Shiuh-Wuu; Wang, Yangyuan 收藏  |  浏览/下载：3/0  |  提交时间：2015/11/13