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| Detection System of Single Event Upset Based onFPGA 会议论文
中国厦门, 2018
作者: Bobo Feng; Cuiping Shao; Huiyun Li
  收藏 | 浏览/下载：19/0 | 提交时间：2019/01/31 |
| On high-quality test pattern selection and manipulation 会议论文
16th IEEE European Test Symposium, ETS 2011, Trondheim, Norway
作者: Feng Yuan; Xiao Liu; Qiang Xu
收藏 | 浏览/下载：4/0 | 提交时间：2015/08/25 |
| Pseudo-Functional Testing for Small Delay Defects Considering Power Supply Noise Effects 会议论文
2011 IEEE/ACM International Conference on Computer-Aided Design, San Jose, CA, United states
作者: Feng Yuan; Xiao Liu; Qiang Xu
收藏 | 浏览/下载：9/0 | 提交时间：2015/08/25 |
| Study on the BeiHang Keystroke Dynamics Database 会议论文
2011 International Joint Conference on Biometrics, Washington, DC, United states
作者: Yilin Li; Baochang Zhang; Yao Cao; Sanqiang Zhao; Yongsheng Gao
收藏 | 浏览/下载：12/0 | 提交时间：2015/08/25 |
| Test Architecture Design and Optimization for Three-Dimensional SoCs 会议论文
2009 Design, Automation and Test in Europe Conference and Exhibition, DATE '09
作者: Li Jiang; Lin Huang; Qiang Xu
收藏 | 浏览/下载：7/0 | 提交时间：2015/08/21 |
| A Generic Framework for Scan Capture Power Reduction in Fixed-Length Symbol-based Test Compression Environment 会议论文
2009 Design, Automation and Test in Europe Conference and Exhibition, DATE '09, Henan Polytechn Univ, Jiaozuo, PEOPLES R CHINA
作者: Xiao Liu; Qiang Xu
收藏 | 浏览/下载：5/0 | 提交时间：2015/08/21 |
| On Reducing Both Shift and Capture Power for Scan-Based Testing 会议论文
Asia and South Pacific Design Automation Conference, Seoul, SOUTH KOREA
Jia LI; Qiang XU; Yu HU; Xiaowei LI
收藏 | 浏览/下载：9/0 | 提交时间：2015/08/21 |
