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CORC

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Quantitative strain characterization of SiGe heterostructures by high-resolution transmission electron microscopy 期刊论文
physica b-condensed matter, 2010, 卷号: 405, 期号: 16, 页码: 3433-3435
Zhao CW (Zhao C. W.); Xing YM (Xing Y. M.); Yu JZ (Yu J. Z.); Han GQ (Han G. Q.)
收藏  |  浏览/下载：100/3  |  提交时间：2010/09/07
High-temperature AlN interlayer for crack-free AlGaN growth on GaN 期刊论文
journal of applied physics, 2008, 卷号: 104, 期号: 4, 页码: art. no. 043516
Sun, Q; Wang, JT; Wang, H; Jin, RQ; Jiang, DS; Zhu, JJ; Zhao, DG; Yang, H; Zhou, SQ; Wu, MF; Smeets, D; Vantomme, A
收藏  |  浏览/下载：74/0  |  提交时间：2010/03/08
Influence of AlN thickness on strain evolution of GaN layer grown on high-temperature AlN interlayer 期刊论文
journal of physics d-applied physics, 2007, 卷号: 40, 期号: 17, 页码: 5252-5255
Liu, W (Liu, W.); Wang, JF (Wang, J. F.); Zhu, JJ (Zhu, J. J.); Jiang, DS (Jiang, D. S.); Yang, H (Yang, H.)
收藏  |  浏览/下载：56/0  |  提交时间：2010/03/29
STRESS  
Influence of cracks generation on the structural and optical properties of GaN/Al0.55Ga0.45N multiple quantum wells 期刊论文
applied surface science, 2006, 卷号: 252, 期号: 8, 页码: 3043-3050
作者:  Zhang SM
收藏  |  浏览/下载：84/0  |  提交时间：2010/04/11
Effect of the longitudinal and transverse stacking period of InAs/GaAs quantum dots on the distribution of strain field 期刊论文
acta physica sinica, 2006, 卷号: 55, 期号: 10, 页码: 5023-5029
Liu YM (Liu Yu-Min); Yu ZY (Yu Zhong-Yuan); Yang HB (Yang Hong-Bo); Huang YZ (Huang Yong-Zhen)
收藏  |  浏览/下载：39/0  |  提交时间：2010/04/11
Chemical composition and elastic strain in AlInGaN quaternary films 期刊论文
thin solid films, 2006, 卷号: 515, 期号: 4, 页码: 1429-1432
Zhou, SQ (Zhou, Shengqiang); Wu, MF (Wu, M. F.); Yao, SD (Yao, S. D.); Liu, JP (Liu, J. P.); Yang, H (Yang, H.)
收藏  |  浏览/下载：36/0  |  提交时间：2010/03/29
Reduction of dislocations in GaN epilayer grown on Si (111) substrates using a GaN intermedial layer 期刊论文
chinese physics letters, 2006, 卷号: 23, 期号: 9, 页码: 2591-2594
Wang JF (Wang Jian-Feng); Zhang BS (Zhang Bao-Shun); Zhang JC (Zhang Ji-Cai); Zhu JJ (Zhu Jian-Jun); Wang YT (Wang Yu-Tian); Chen J (Chen Jun); Liu W (Liu Wei); Jiang DS (Jiang De-Sheng); Yao DZ (Yao Duan-Zheng); Yang H (Yang Hui)
收藏  |  浏览/下载：29/0  |  提交时间：2010/04/11
Comparison between double crystals X-ray diffraction micro-Raman measurement on composition determination of high Ge content Si1_xGex layer epitaxied on Si substrate 期刊论文
journal of materials science & technology, 2006, 卷号: 22, 期号: 5, 页码: 651-654
Zhao L (Zhao Lei); Zuo YH (Zuo Yuhua); Cheng BW (Cheng Buwen); Yu JZ (Yu Jinzhong); Wang QM (Wang Qiming)
收藏  |  浏览/下载：38/0  |  提交时间：2010/04/11
Structural characterization of AlGaN/GaN superlattices by x-ray diffraction and Rutherford backscattering 期刊论文
superlattices and microstructures, 2006, 卷号: 40, 期号: 3, 页码: 137-143
Zhou SQ (Zhou Shengqiang); Wu MF (Wu M. F.); Yao SD (Yao S. D.); Zhang BS (Zhang B. S.); Yang H (Yang H.)
收藏  |  浏览/下载：24/0  |  提交时间：2010/04/11
Strain analysis of InP/InGaAsP wafer bonded on Si by X-ray double crystalline diffraction 期刊论文
materials science and engineering b-solid state materials for advanced technology, 2006, 卷号: 133, 期号: 1-3, 页码: 117-123
Zhao HQ (Zhao Hong-Quan); Yu LJ (Yu Li-Juan); Huang YZ (Huang Yong-Zhen); Wang YT (Wang Yu-Tian)
收藏  |  浏览/下载：32/0  |  提交时间：2010/04/11

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