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Focused ion beam preparation of microbeams forin situmechanical analysis of electroplated nanotwinned copper with probe type indenters 期刊论文
JOURNAL OF MICROSCOPY, 2020, 卷号: 279, 期号: 3, 页码: 212-216
作者:  Robertson, Stuart;  Doak, Scott;  Sun, Fu-Long;  Liu, Zhi-Quan;  Liu, Changqing
收藏  |  浏览/下载:28/0  |  提交时间:2021/02/02
Recent advances in AFM-based biological characterization and applications at multiple levels 期刊论文
SOFT MATTER, 2020, 卷号: 16, 期号: 39, 页码: 8962-8984
作者:  Liang WF(梁文峰);  Shi, Haohao;  Yang XL(杨谢柳);  Wang, Junhai;  Yang WG(杨文广)
收藏  |  浏览/下载:27/0  |  提交时间:2020/10/31


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