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西安理工大学 [5]
北京大学 [3]
中南大学 [2]
北京航空航天大学 [1]
深圳先进技术研究院 [1]
华南理工大学 [1]
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期刊论文 [12]
会议论文 [3]
发表日期
2017 [15]
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Investigation the Effect of Silane onto Fabricating Polymer Insulation Layer by Spin-coating for Through Silicon Vias
会议论文
Harbin, China
作者:
Qiang Liu
;
Guoping Zhang
;
Rong Sun
;
S. W. Ricky Lee
;
Ching-Ping Wong
收藏
  |  
浏览/下载:14/0
  |  
提交时间:2018/02/02
Effect of ultrasound on copper filling of high aspect ratio through-silicon via (TSV)
期刊论文
Journal of the Electrochemical Society, 2017, 卷号: 164, 期号: 4, 页码: D126-D129
作者:
Xiao, Hongbin
;
Wang, Fuliang*
;
Wang, Yan
;
He, Hu
;
Zhu, Wenhui
收藏
  |  
浏览/下载:8/0
  |  
提交时间:2019/12/03
Numerical modeling and experimental verification of copper electrodeposition for through silicon via (TSV) with additives
期刊论文
Microelectronic Engineering, 2017, 卷号: 170, 期号: Volume 170, 页码: 54-58
作者:
Xiao, Hongbin
;
He, Hu
;
Ren, Xinyu
;
Zeng, Peng
;
Wang, Fuliang*
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2019/12/03
TSV
Copper filling
Electrodeposition
Numerical modeling
Additives
Influence of Viscoelastic Underfill on Thermal Mechanical Reliability of a 3-D-TSV Stack by Simulation
期刊论文
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2017
Zeng, Qinghua
;
Guan, Yong
;
Su, Fei
;
Chen, Jing
;
Jin, Yufeng
收藏
  |  
浏览/下载:6/0
  |  
提交时间:2017/12/03
Microbump
thermal mechanical reliability
through-silicon-via
underfill
viscoelasticity
SOLDER
WARPAGE
FATIGUE
PACKAGE
Fabrication and Comparison of Bumpless Wafer-on-Wafer Integration and Bump-Containing Chip-on-Chip Integration
期刊论文
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 2017
Guan, Yong
;
Zhu, Yunhui
;
Ma, Shenglin
;
Zeng, Qinghua
;
Chen, Jing
;
Jin, Yufeng
收藏
  |  
浏览/下载:6/0
  |  
提交时间:2017/12/03
3-D packaging
chip-on-chip (CoC) integration
reliability
through silicon via (TSV)
wafer-on-wafer (WoW) integration
PIEZORESISTIVE STRESS SENSOR
THROUGH-SILICON
RELIABILITY
INTERCONNECTS
VOLUME
VIAS
An Enhancement of Crosstalk Avoidance Code Based on Fibonacci Numeral System for Through Silicon Vias
期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2017
Cui, Xiaole
;
Cui, Xiaoxin
;
Ni, Yewen
;
Miao, Min
;
Jin Yufeng
收藏
  |  
浏览/下载:7/0
  |  
提交时间:2017/12/03
Crosstalk
crosstalk avoidance code (CAC)
Fibonacci number system (FNS)
redundant codeword
redundant number
through silicon via (TSV)
CHIP
DESIGN
A Region-Based Through-Silicon via Repair Method for Clustered Faults
期刊论文
IEICE TRANSACTIONS ON ELECTRONICS, 2017, 卷号: E100C No.12, 页码: 1108-1117
作者:
Nie, M
;
Yan, AB
;
Liang, HG
;
Ni, TM
;
Huang, ZF
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2019/04/24
3D ICs
yield enhancement
TSV redundancy
reparability
additional delay overhead
Effect of ultrasound on copper filling of high aspect ratio through-silicon via (TSV) (EI收录)
期刊论文
Journal of the Electrochemical Society, 2017, 卷号: 164
作者:
Xiao, Hongbin[1,2]
;
Wang, Fuliang[1,2]
;
Wang, Yan[1,2]
;
He, Hu[1,2]
;
Zhu, Wenhui[1,2]
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2019/04/24
Aspect ratio
Copper
Electronics packaging
Filling
Integrated circuit manufacture
Ultrasonics
An Effective Approach of Improving Electrical and Thermo-Mechanical Reliabilities of Through-Silicon Vias
期刊论文
2017, 卷号: 17, 页码: 106-112
作者:
Wang, Fengjuan
;
Yu, Ningmei
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2019/12/20
Crosstalk noise
highly doped layer (HDL)
keep-out zone (KOZ)
through-silicon via (TSV)
An Ultracompact Butterworth Low-Pass Filter Based on Coaxial Through-Silicon Vias
期刊论文
2017, 卷号: 25, 页码: 1164-1167
作者:
Wang, Fengjuan
;
Yu, Ningmei
收藏
  |  
浏览/下载:9/0
  |  
提交时间:2019/12/20
Coaxial through-silicon via (TSV)
low-pass filter (LPF)
S-parameters
spiral inductor
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