Visual Tracking With Motion Distortion Removal for Nanomanipulation Inside SEM | |
Fu, Xiang5; Yang, Yuting5; Sun, Zhenhuan5; Su, Hu4; Li, Youfu3; Li, Teng5; Liu, Song1,2 | |
刊名 | IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT |
2023 | |
卷号 | 72页码:12 |
关键词 | Dynamic visual tracking motion distortion removal nanomanipulation scanning electron microscope (SEM) image denoising |
ISSN号 | 0018-9456 |
DOI | 10.1109/TIM.2023.3318726 |
通讯作者 | Li, Teng(liteng1@shanghaitech.edu.cn) ; Liu, Song(liusong@shanghaitech.edu.cn) |
英文摘要 | The article investigates the problem of visual tracking of moving objects in nanomanipulation inside a scanning electron microscope (SEM). Image noise is a primary concern when dealing with the problem, which includes the inherent statistical noise and that induced by the motion distortion. A visual tracking method with SEM image denoising algorithm is proposed. The denoising algorithm is well incorporated with robot motion by innovatively leveraging the image Jacobian matrix technique. The denoising algorithm removes image noise and provides a more realistic image. On this basis, template matching is utilized to achieve visual tracking on the image plane. Experimental results show that the visual tracking performance on the image plane was well improved by 31.4% for the point feature, 60.6% for the line feature, and 52.1% for the area feature in terms of root mean square error (RMSE) compared to that without motion distortion removal. Comparison experiments validate the state-of-the-art performance achieved by the proposed method and thus the superiority. |
资助项目 | Shanghai Pujiang Talents Program[21PJ1410500] |
WOS关键词 | MANIPULATION ; NOISE |
WOS研究方向 | Engineering ; Instruments & Instrumentation |
语种 | 英语 |
出版者 | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC |
WOS记录号 | WOS:001085217500017 |
资助机构 | Shanghai Pujiang Talents Program |
内容类型 | 期刊论文 |
源URL | [http://ir.ia.ac.cn/handle/173211/54337] |
专题 | 精密感知与控制研究中心_精密感知与控制 |
通讯作者 | Li, Teng; Liu, Song |
作者单位 | 1.Shanghai Engn Res Ctr Intelligent Vis & Imaging, Shanghai 201210, Peoples R China 2.ShanghaiTech Univ, Sch Informat Sci & Technol, Shanghai 201210, Peoples R China 3.City Univ Hong Kong, Dept Mech & Biomed Engn, Hong Kong, Peoples R China 4.Chinese Acad Sci, Inst Automat, Beijing 100190, Peoples R China 5.ShanghaiTech Univ, Sch Informat Sci & Technol, Shanghai 201210, Peoples R China |
推荐引用方式 GB/T 7714 | Fu, Xiang,Yang, Yuting,Sun, Zhenhuan,et al. Visual Tracking With Motion Distortion Removal for Nanomanipulation Inside SEM[J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,2023,72:12. |
APA | Fu, Xiang.,Yang, Yuting.,Sun, Zhenhuan.,Su, Hu.,Li, Youfu.,...&Liu, Song.(2023).Visual Tracking With Motion Distortion Removal for Nanomanipulation Inside SEM.IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,72,12. |
MLA | Fu, Xiang,et al."Visual Tracking With Motion Distortion Removal for Nanomanipulation Inside SEM".IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT 72(2023):12. |
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