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Formation and Evolution of Cu-Sn Intermetallic Compounds in Ultrasonic-Assisted Soldering
Yu, Weiyuan; Liu, Yingzong; Liu, Yun
刊名JOURNAL OF ELECTRONIC MATERIALS
2019-09
卷号48期号:9页码:5595-5602
关键词Ultrasonic-assisted soldering interfacial intermetallic compounds microstructure tin solder
ISSN号0361-5235
DOI10.1007/s11664-019-07405-1
英文摘要Interfacial intermetallic compounds (IMCs) help determine the reliability of soldered joints; thus, it is necessary to understand their formation and evolution. This study focus on Cu-Sn IMCs formed in ultrasonic-assisted soldering (UAS), wherein the formation of IMCs at the Sn/Cu interface is controlled by changing the ultrasonic action time. After being subjected to ultrasonic vibration, the IMCs at the Cu/Sn solid-liquid interface are continuously crushed, dissolved, and formed, which occurs successively in the Cu6Sn5 and Cu3Sn layers. The relationship between the thickness of the IMC layer and ultrasonic action time in Cu-Sn samples was identified. Simultaneously, the growth pattern of Cu6Sn5 grains in the Sn solder is transformed, and the tin solder (Sn solder) is kept in a dynamic non-equilibrium state with IMCs at the Sn/Cu interface through UAS. More Cu6Sn5 grains formed and were evenly distributed in the joint after cooling, which improves the performance of the joints.
资助项目National Natural Science Foundation of China[51465032][51665031]
WOS研究方向Engineering ; Materials Science ; Physics
语种英语
出版者SPRINGER
WOS记录号WOS:000477974300025
状态已发表
内容类型期刊论文
源URL[http://119.78.100.223/handle/2XXMBERH/31590]  
专题实验室建设与管理处
通讯作者Yu, Weiyuan
作者单位Lanzhou Univ Technol, State Key Lab Gansu Prov, Adv Proc & Recycling Nonferrous Met, Lanzhou 730050, Gansu, Peoples R China
推荐引用方式
GB/T 7714
Yu, Weiyuan,Liu, Yingzong,Liu, Yun. Formation and Evolution of Cu-Sn Intermetallic Compounds in Ultrasonic-Assisted Soldering[J]. JOURNAL OF ELECTRONIC MATERIALS,2019,48(9):5595-5602.
APA Yu, Weiyuan,Liu, Yingzong,&Liu, Yun.(2019).Formation and Evolution of Cu-Sn Intermetallic Compounds in Ultrasonic-Assisted Soldering.JOURNAL OF ELECTRONIC MATERIALS,48(9),5595-5602.
MLA Yu, Weiyuan,et al."Formation and Evolution of Cu-Sn Intermetallic Compounds in Ultrasonic-Assisted Soldering".JOURNAL OF ELECTRONIC MATERIALS 48.9(2019):5595-5602.
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