Automatic Detection and Fitting of Ellipse Markers Using EllipseNet
Zhengda Qian3,4; Fulin Tang4; Bingxi Liu3,4; Yujie Fu3,4; Shaohuan Wu2; Xiaohong Jia1; Yihong Wu3,4
2022-05-24
会议日期August 21-25, 2022
会议地点Montréal, Québec
英文摘要

Ellipses are important elements in projective ge-
ometry. Accurate extraction of ellipse information is the first
step in many computer vision applications, such as ellipse-based
camera calibration and camera pose estimation. At present, most
ellipse detection algorithms rely on the edge features extracted
by Canny, which leads to a number of wrong detection results
since non-ellipse edges features are also involved. To address this
problem, this paper proposes a novel ellipse marker detection
neural network, called EllipseNet. Notably, we propose a new loss
function to enhance the rotation perception ability of EllipseNet.
Furthermore, a novel ellipse marker data enhancement method is
proposed for saving the time cost of labelling ellipse parameters.
Experiments show that EllipseNet can improve the detection
precision of ellipse regions by more than 3% improvement
compared with other SOTA general object detectors

产权排序1
语种英语
内容类型会议论文
源URL[http://ir.ia.ac.cn/handle/173211/48721]  
专题自动化研究所_模式识别国家重点实验室_机器人视觉团队
通讯作者Yihong Wu
作者单位1.Academy of Mathematics and Systems Science, Chinese Academy of Sciences, Beijing, China
2.School of Mathematics and Statistics, Shandong University
3.School of Artificial Intelligence, University of Chinese Academy of Scineces
4.National Laboratory of Pattern Recognition, Institute of Automation, Chinese Academy of Sciences, Beijing, China
推荐引用方式
GB/T 7714
Zhengda Qian,Fulin Tang,Bingxi Liu,et al. Automatic Detection and Fitting of Ellipse Markers Using EllipseNet[C]. 见:. Montréal, Québec. August 21-25, 2022.
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