Automatic Detection and Fitting of Ellipse Markers Using EllipseNet | |
Zhengda Qian3,4; Fulin Tang4; Bingxi Liu3,4; Yujie Fu3,4; Shaohuan Wu2; Xiaohong Jia1; Yihong Wu3,4 | |
2022-05-24 | |
会议日期 | August 21-25, 2022 |
会议地点 | Montréal, Québec |
英文摘要 | Ellipses are important elements in projective ge- |
产权排序 | 1 |
语种 | 英语 |
内容类型 | 会议论文 |
源URL | [http://ir.ia.ac.cn/handle/173211/48721] |
专题 | 自动化研究所_模式识别国家重点实验室_机器人视觉团队 |
通讯作者 | Yihong Wu |
作者单位 | 1.Academy of Mathematics and Systems Science, Chinese Academy of Sciences, Beijing, China 2.School of Mathematics and Statistics, Shandong University 3.School of Artificial Intelligence, University of Chinese Academy of Scineces 4.National Laboratory of Pattern Recognition, Institute of Automation, Chinese Academy of Sciences, Beijing, China |
推荐引用方式 GB/T 7714 | Zhengda Qian,Fulin Tang,Bingxi Liu,et al. Automatic Detection and Fitting of Ellipse Markers Using EllipseNet[C]. 见:. Montréal, Québec. August 21-25, 2022. |
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